The S6 Fully Auto Wafer/Chip Probe System is designed to address the challenge for the emergent applications for Sensing and Optic Communications markets. Features a flexible probing platform and a highly efficient loading system, the system delivers optimal testing capability to meet various requirements for Photo Detectors, VCSEL, and other optical communication device applications. For Photo Detector application, S6 provides low noise level dark current (DC) testing, accurate light source, responsivity measurement, and optoelectronic measurements. Towards VCSEL application, S6 supports Light-current-voltage (LIV) sweep test, Far Field (FF) measurement, and Near Field (NF) measurement. Furthermore, MPI also provides various measurement optic options and a wide range of accessories such as chuck systems, probe cards, and positioners with force control edge sensors that facilitates excellent support and creates a flexible testing platform matches to your specific needs.