タカノ products are everywhere around you.
We will put whole our product like inspection and metrology systems for Wafer Level Package to the exhibition.
・Inspection and Metrology System for Semiconductor
① [Vi Series] Pattern Inspection
② [WM Series] Non-Pattern Surface Inspection System
③[ALTAX] Hi-speed Height Inspection for Bump Height
④ Depth Metrology for TSV/Trench Depth Measurement
⑤ AFM(Atomic Force Microscope)
・Laser System (UV Laser)
Looking forward to seeing you at SEMICON Taiwan 2019.