NI semiconductor test customers report 10X improvement in test times while maintaining measurement and performance requirements. To test smart devices, organizations are transitioning from traditional ATE and box instruments to a platform-based approach. NI's platform-based approach from characterization to production offers cost-optimized, high-performance test solutions for RF and mixed-signal test. Come to NI’s booth to understand more about its uniqueness.
Zhubei City, Hsinchu County
Seoul, 06164 Korea