Aehr Test Systems is a worldwide provider of test and burn-in systems with an installed base of more than 2,500 systems worldwide for packaged part and wafer-level testing of digital integrated circuits, silicon photonics, silicon carbide, and gallium nitride power devices.
Established in 1977, the company develops and manufactures systems that are designed to reduce the cost of test and perform reliability screening (burn-in) of complex logic, memory and power integrated circuits. Aehr's systems can be configured for burning-in and testing devices as packaged parts, bare die or full wafer in a massively parallel, high-volume production solution.