AEM’s M5S-HD system has a flexible architecture supporting up to 1024 digital pins and 128 1A DPS in a 5-slot compact air-cooled system.

Available, a range of modular FPGA based instruments that can fit in any slot to configure a cost-effective test solution for digital, mixed signal or application specific solutions

The instruments enable a future proof roadmap of application specific enhancements. Instrument performance is optimized with a suite of calibration programs for timing and levels accuracy.

The SW tools support Industry standards for factory automation, data logging and pattern conversion. The Software is built on a proven multi-threading architecture supporting parallel test >256 sites with minimal overhead. A range of manipulators is available for docking to probers and handlers to support full test cell integration. This platform provides a cost effective ATE test solution for many applications from design, characterization, and debug to high volume manufacturing at wafer and final test.

AEM is also offering the M10S-HD (2048 digital pins and 256 1A DPS) and application specific solutions such as CMOS Image Sensors.

AEM’s ATOM IC Test Handler can handle most standard semiconductor packages ranging in size from 6mm to 55mm. The system can accommodate most BGA, LGA, QFP, QFN, PLCC, POP, DIP, and PGA devices and many others. Smaller sizes may be handled in many cases.

The system has two binning modes:

Mode 1 (SORT, 1 IN 2 OUT) utilizes one input tray with devices to be tested, and two empty output trays. - The parts are picked from the input tray, presented to the contactor, and then sorted to the appropriate output tray based on the binning signal sent by the tester.

Mode 2 (ALL TEST, 3 INPUT) utilizes up to 3 input trays, all containing devices to be tested. – Each device is tested and returned to the same location in the same tray from which it was taken.

The system also has a device precising option. If selected, the system can precise the part to insertion into the test socket. Precising is used in cases where the device tray has insufficient precision and/or the test socket has insufficient lead-in to allow the device to be dropped correctly and accurately. Device rotation (optional) can also be performed.

The system utilizes a simple digital input/output logic methodology to interface with a test system. RS232 and GPIB communication options are also available.

The system is flexible, with options to be used as a table-top operation, or on a cart, to interface with most standard ATE test equipment (test heads).

The system can be used with several thermal control systems to enable ATC and hot/cold testing. The temperature range of the test is determined by the device to be tested, its power dissipation, and the type of thermal control system used.

NESTEK PIN can be produced with barrel outer diameter of ø0.15~7.0 and length of 1.5~93.0mm.