Mobile AP, Server, Graphic, CPU, Memory controller, ASIC, Automotive
V93K DD, U-Flex DD , T2000, J750, Catalyst and etc.
Integrated probe card solution
> Electrical characteristic : High speed, Low signal loss, Cres stability
> Mechanical performance : Wide temperature test range, Good alignment and probe mark
> Full array pitch ≥50um, Pin count up to 40,000pins
> After service : Global service with experienced FAE (USA, China, Taiwan, Singapore)