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POMME TECHNOLOGIES CO., LTD

新竹縣,  Taiwan
http://www.pomme-tech.com
  • Booth: Q5836

Overview

POMME Technology Co., Ltd.

Pomme Technology was established in 2015 and is located in Hsinchu, Taiwan. It is engaged in high-end wafer test integration and design services for the semiconductor industry, focusing on providing you with the best efficient wafer parameter test solutions. Such as IC Design house, foundry, IDM, testing company, assembly and packaging company, etc., to simplify work for engineers in different departments (such as: technology research and development, quality and reliability assurance, failure analysis, manufacturing, etc.). POMME can help turn all the measurement and analysis under numerous test results into a simple job, speeding up product throughput throughout semiconductor production.

Pomme Technology is the "Semiconductor Measurement Instrument Solution" partner of Keysight Technologies, a world-renowned instrument manufacturer. With more than 16 years of long-term cooperation experience, POMME has developed into a semiconductor industry test integration system provider. The only and most trusted partner of customers, has the most professional R&D technical team, upholds the spirit of quality first and customer satisfaction, and grows together with customers, suppliers and employees.

Since its establishment, it has served the semiconductor industry chain in the Asia-Pacific region, with more than 200 customers. We use experienced teamwork to run your test work quickly and efficiently. We can provide test solutions that meet your unique needs every time.


  Press Releases

  • (Jul 03, 2023)
  • (Jul 03, 2023)

  Products

  • 探針台
    手動探針台
    半自動探針台
    四點探針台...

  • 1. 手動探針台 : MF-P2000-A、MF-P3000-A

    MF-P2000-A

    產品特性

    ● Fully Shielding Testing Chamber
    Fully Shielding Chamber provide high precision testing result. Configure with standard chuck with upgrades to coaxial or triaxial for low-leakage current tests.
    Moreover, the electrical testing with the APT probes and the fully shielding chamber achieve the Ultra low-leakage probe station.

    ● Multi DUT Testing System
    Multi DUT testing System provide user flexible electrical testing condition on different DUTs.
    While build model card extraction and FAT with Multi DUT Testing Systems can achieve the experiment more efficiency and flexible.

    ● Low Leakage Performance
    Low Leakage Performance dominates the low current testing results.
    With Fully Shielding Testing Chamber and Kelvin Probes
    Testing System easily achieve the 10fA low leakage @ 0V bias.

    MF-P3000-A

    2. 半自動探針台 :SF-C1500、SF-P5040

    SF-C1500

    產品特性

    Semiauto probe station for high accuracy measurements of low signals on the wafer up to 6-inch diameter with inker.

    Main Features:

    • Joystick chuck movement control
    • Inker unit for fault crystals
    • Contact sensor to check needle contact with the DUT
    • 3 microscope images at various magnifications ensure an optimum image of the DUT and the area around it
    • Pieces of a wafer can be processed
    • Сhamber provides electromagnetic shielding for high-accuracy measurements

    SF-P5040

    產品特性

    Semiauto probe station for display testing with dimensions up to 500×400 mm

    Main Features:

    • Special chuck for samples with dimensions up to 500×400 mm
    • Two independent holders for probe card
    • Possibility for pixel and TEG testing
    • 3.  四點探針台

    產品特性

    Automatic four-probe station for measuring the resistivity and surface resistance by the four-probe method (Kelvin method) according to ASTM F84-99 standard. The unit is equipped with a thermostatically controlled plate holder, which allows measurements at different temperatures, as well as to measure the temperature coefficient of resistance. Based on the measurement results, 3D diagrams of the distribution of the investigated parameter over the surface of the plate are constructed.

    Features:

    ● Thermostated sample holder with a temperature range from +10 to +200 ° С

    ● Carrying out measurements according to ASTM F84-99

    ● Replaceable four-probe measuring head

    ● Construction of 2D / 3D diagrams based on measurement results

    ● Measurements of temperature coefficient of resistance (TCR)

    ● Easy creation of automatic measurement tests