Welcome to Frontier Semiconductor
Overview
Frontier Semiconductor, Inc, (FSM), offers a range of advanced metrology products and solutions for semiconductor, LED, Solar, FPD, Data Storage and MEMS applications. We have over 25 years experience in stress measurement, film adhesion testing, wafer topography metrology, and electrical characterization. Our latest offerings include unique technology to meet the metrology needs of 3DIC manufacturing. We have shipped our first 450mm wafer tools.
FSM has local sales and support offices in all major semiconductor clusters. Other areas are covered by a network of local representatives.
OUR COMPANY
• Founded in 1988 in USA.
• Management driven by Customer satisfaction facilitated by offering the Best- Known-Method in our customized metrology solutions.
• Partnership with Major Semiconductor makers to enable a measurement eco-system and to align with customer’s yield improvement and cost reduction initiatives.
• Direct onsite support experience in USA, Europe, Korea, Asia, Philippines 24/7.
• Metrology tools for IC, MEMS & Photo- voltaic manufacturing - optical, mechanical and electrical probes.
• World-wide presence for Sales & Service available specially in USA, Europe, Korea, Asia and Philippines.
FSM Company Profile -Market Share in Various Fields
RAPID METROLOGY CONFIDENTIAL
Frontier Semiconductor (FSM), offers a range of advanced metrology products and solutions for
semiconductor, LED, Solar, FPD, Data Storage and MEMS applications.
Frontier Semiconductor (FSM) has over 36 of years experience in:
• Stress Measurement,
• Film Adhesion Testing,
• Wafer Dimensional Metrology
• Electrical Characterization.
Over 1000+ metrology tools sold worldwide:
a. Film stress measurement tools, also available in FSM 900TC which provides CTE features.
b. Wafer thickness and via depth measurement tools ( TTV for ultra thin wafer: Taiko wafer)
Products