HI-TECH IMAGING INC.

新竹縣,  Taiwan
http://www.htiweb.com/
  • Booth: K3385

Your Ultimate Strategic Partner

Overview

YOUR DEPENDABLE PARTNER IN SOLUTION-SPECIFIC INSTRUMENTATION

That’s us, Hi-Tech Instruments (HTI)

As a team that has garnered an enviable reputation as ‘the local partner in Hi-Tech Instruments’, HTI is positioned to deploy the vast expertise and specialised knowledge to serve ASEAN and global markets beyond the region.

Our partnerships with the world’s leading manufacturers have enabled us to reach the highest level of  sophistication in imaging and characterizing both micro- and nano-worlds. HTI takes pride in providing true customer specific solutions based on light, laser, x-ray, ion and electron excitation of materials.

Every unique success story is made possible through our unrivalled solution-specific approach. We have assisted customers in the fields of semiconductor, material science, green technology, nanotechnology, life and medical sciences, data storage technology, precision machining, environmental, earth and planetary sciences.

Our broad instrumentation range, in-house laboratory coupled with our expertise and experience cuts turnaround time to a minimum, thus enabling all of our new   or existing customers to expeditiously implement our solutions into their laboratories or facilities.

HTI has continuously achieved high level of customer satisfaction through our proven and documented track record of outstanding tool uptime and exceptional service records. Professional support, consultation, comprehensive in-house training courses as well as our ability to anticipate our client’s needs are attributes that engraved in HTI’s reputation. 

Hi-Tech Instruments ……..........…you might say that we are “instruments” to the solution

  Products

  • ION-TOF TOF-SIMS and Low Energy Ion Scattering
    Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

    A very sensitive surface analytical technique. It provides detailed elemental and molecular information about the surface, thin layers, interfaces of the sample, and gives a full 3D analysis.

    ...

    • Tofsims M6
    The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research

    - High lateral resolution (< 50 nm) with the new Nanoprobe 50

    - Mass resolution > 30,000

    - Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously

    - Unmatched dynamic range and detection limits

    - TOF MS/MS with CID fragmentation for molecular structure elucidation

    - New flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction

    - Sophisticated SurfaceLab 7 software including fully integrated Multivariate Statistical Analysis (MVSA) software package

  • ION-TOF Low Energy Ion Scattering
    Low Energy Ion Scattering (LEIS)

    An extremely surface sensitive technique which provides information about the composition of the first atomic layer. It also allows to analyse the sub-surface atomic layers and to determine layer thicknesses....

    • Qtac

    The Qtac is a high sensitivity Low Energy Ion Scattering (LEIS) instrument. It is extremely surface sensitive, providing quantitative elemental characterisation of the top atomic layer.

    This instrument has been developed to include small spot analysis, surface imaging, and both static and dynamic depth profiling.

    Its unique surface sensitivity makes the Qtac the perfect tool to study surface processes. The Qtac provides valuable information in many production and research areas on materials such as catalysts, semiconductors, metals, polymers, and fuel cells.

Categories

203 Equipment, Inspection & Measurement
  • Defect; Particle; Bump; Contamination Detection, Review or Inspection
  • Wafer; Substrate Metrology; Topology; Nanotopography; Flatness Measurement; Crystalline Orientation
  • Wire Bonding Inspection; Test
    • 205 Equipment, Nanotechnology
  • Equipment, Nanotechnology Tools
    • 208 Equipment, Test
  • Failure Analysis Systems
    • 305 Materials, Nanotechnology
  • Materials, Nanotechnology
    • 308 Materials, Substrate
  • Compound Semiconductor substrates (GaAs on Silicon; GaN; InP; SiGe, etc.)
  • Gallium Arsenide (GaAs); Sapphire Substrates
  • solar cell substrates; crystalline silicon (c-Si); thin film
  • Substrate Materials
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