ProbeLeader Co., Ltd

ProbeLeader provides consumables to the semiconductor and optical industries.

We have TDR Wafer, adhesive of  advanced package, lens module and mini/Micro LED; SiC substrate, dicing board and dicing saw blade … etc.

Fine Particle Visualization System can capture > 0.1um suspended particles through a high-performance lens in a room or a space. The system can detect small particles even under normal ambient light, which can solve the problem of low quality caused by particle pollution.

In response to the market demand of automotive and compound semiconductors, ProbeLeader provides high voltage, high power, MEMS, high-speed CIS, high temperature probe cards to meet the needs of electric vehicles, AR / VR, 5G, WiFi... etc. to meet the different testing needs of customers.

ProbeLeader distributes AOI equipment across semiconductor, camera lens, glass, automotive industries. The AOI systems can detect defects on different materials including Silicon, Glass, Lens, Ceramic …

We have experiences of multi-layer glass/lens, CMOS module/package, SiC/GaN module and silicon wafer.

We will do the best to work for customer’s quality concern.  

For IC package yield test, ProbeLeader provides test carrier board (PCB) design and simulation services with product applications including high frequency, high voltage and high current signals USB 3.2 ~ 4.0, PCIe 4.0, PMIC, CIS MIPI, HDMI, Display Port, DDR 4, ... etc.