BRUKER SURFACE MEASUREMENT SOLUTIONS - For SEMICON
Overview
Bruker Nano Surfaces provides critical surface analysis instruments for research and production. Our broad range of application focused instruments from AFM, 3D Optical Profilers to Nano-Mechanical Testers and Tribometers support R&D, process development and manufacturing needs with good repeatability and accuracy in back-end, front-end Semiconductor, MEMS manufacturing and IC packaging.
Whatever your surface measurement and surface analysis needs, Bruker has a high-performance solution for you.
Visit us at Booth K3082 to learn more about Bruker AFM and 3D Optical Solutions.or visit www.Bruker.com/Nano