The microscope thermography from ViewOhre Imaging realizes micron-level temperature measurement that cannot be measured with thermo-couples or ordinary thermography. We have minimized the measurement errors happened in micron-level measurement with our own calibration and correction and also enhanced detection sensitivity. Wafers, semiconductor parts, power semiconductors, OLED materials, new under-developing materials, equipment for semiconductor manufacturing, heat sources, nozzles, etc., can be measured for monitoring small temperature changes, heat generation, and heat resistance related to various semiconductors. Finally, the new application software has been released. It can assist you for the thermal-movie data analysis which requires big efforts because of the large amount of data. You can easily analyze the changes of heat in the data.