Tesec Corporation

Inheriting TESEC's strength in high-voltage and high-current measurement technology, the tester has significantly increased the productivity compared to the conventional testers by measuring multiple chips simultaneously.
One-Pass test of Avalanche measurement*1 is supported to meet the demand of today's market.
（*1） Dedicated measurement unit, which is only for 8 parallel model, is required. Also, it may not be applicable depending on the test condition and measurement environment.

Feature

・Improved cost performance through simultaneous measurement of multiple chips (8 / 16 parallel)
・DC measurement and Avalanche measurement in 1 test system
・Significantly shortened the data transmission time by LAN connection
・Faster relay switching shortened the measurement time
・Parallel measurement is stabilized by our accumulated measurement technology (Max 2 kV / 20 A)
・Voltage and Current Limitation settings reduce the load on the probe pin
・Automatically calculate the number of chips to be measured simultaneously so that total required current of the chips to be lower than the predetermined maximum applicable current value (current capacity of the prober chuck)

1.2 kV / 65 A (130 A for C-E) measurement is available as a standard and that can be expanded to 2.2 kV / 65 A (200 A for C-E). With an optional unit, at a maximum of 5 kV / 2000 A measurement is available.

With its high versatility, the tester can be used in various applications such as the wafer test when a prober is connected and the final test when a handler is connected.

Feature

・VI Source Measure Modules Structure
・1.2 kV / 130 A (up to 2.2 kV / 200 A ) measurement capability
・High Speed Measurement
・Multi-device test (Simultaneous measurement of 2-in-1 device such as Dual Gate FET2)
・Wafer parallel test (2-chip simultaneous measurement)
・On-Screen Waveform Monitor
・Conventional High Current Unit and High Voltage Unit of TESEC are applicable.

It provides the optimized testing solutions for IPD/IPM, which is a combination of Logic ICs and Power Devices, and various other devices.

Feature

・Utilized the measurement technology of testers for power discrete device.
・Maximum 2.2kV/67A (max 200A) measurement capability. Expandable by adding external units.
・Supports two device parallel measurements.
・Easy language-less test program creation (fill-in-the-blank method)
・High-speed leakage current measurement
・Various bias application waveforms and timing

Feature

・Measurement results are displayed on the front panel display
・Raised temperature ΔT can be displayed as a calculation result
・Thermal resistance Rth can be displayed as a calculation result
・Multi-test function
・60 test programs can be stored
・Contact Check/Open, Short Check
・Oscillation Detection
・Operation can be controlled from TESEC DC Tester
・Gate Limit Voltage can be set and Device Protection Circuit from over heating is equipped
・GP-IB/RS-232C interface enables external equipment to control this tester
・Function Check Unit (4321-AB) can be connected (option)

■ Optional Software Examples
・Software to control the tester from PC
(Test program creation, data collection, and counter collection)
・Software to collect measurement data using the Function Check Unit

VDS(SUS) at the current value specified by the IH can also be measured.
With the conventional measurement method, applied current is limited by applied voltage, moreover, the MOSFET has a characteristic that as the ON Resistance lowers the current required to measure increases; thus, the method became difficult to measure the MOSFET of medium breakdown voltage (several tens of voltage).
To accomplish the task, new measurement methods* are added to perform the high current measurement, and the voltage and current this tester can apply are respectively increased to 300 V and 200 A so that it is now capable of measuring wider range of devices.
*The VD-OFF mode is added to separate the VD power at Avalanche and the Time-Trip mode is added to turn the devices off after the applying current for specified time.

Feature

・N/P channel measurement with one test head
・Peak Current (IDP) measurement at Avalanche test
・Gate ON Time measurement
・Repeat test up to 250 times
・Multi-test function (with fixed VD)
・60 test programs can be stored
・Programmable coil automates the coil switching (Option)
・VD-OFF mode (Optimized for Low ON Resistance MOSFET)
・Self-Check Function
・Time-Trip mode

■Optional Software Examples
・Software to control the tester from PC
(Test program creation, data collection, and counter collection)

 Parallel measurement is available at up to 4 test stations by connecting the 3430-SW and respective test stations provided for test items. (Standard: 2 test stations)
Whole system can be controlled by on computer.

Feature

・Low inductance structure reproduces ideal waveforms
・High speed waveform analysis shortened the test time drastically from the conventional model