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S.E.R. Corporation

Shinagawa-ku,  Tokyo 
Japan
http://www.ser.co.jp
  • Booth: L1023

We Solve Your Interconnect Challenges.

Overview

SER is established in 1984, we are global leading supplier of high-quality probe products. We can provide with wide variety probe application. We also provide ideal solution for your challenging requirement with our customized design connector/socket and engineering capabilities which can support high-frequency devices.

  Press Releases

  • We introduce made in Japan high-quality spring probes for solve your requirements. Our new product lines are below.

    - Super short probe : is for high frequency device testing. This has short test height and have benefit for high frequency characteristic.

    - Scrub contact probe : can provide stable contact characteristic on IC test floor.

    -  Non-magnetic probe : can support non-magnetic test environment. It is suite for gyro censor and electric compass testing.

    We introduce high-quality spring probe application which has design and engineering strength.

    - Coaxial IC soket : can support 80GHz signal test.

    - Millimeter wave interposer : is ideal solderless solution for high-frequency signal interconnection. 

    - KTC connector : is multi-channel coaxial solderless connector for 70GHz high-speed signal. (1.6mm pitch)

  Products

  • Multi-impedance socket
    SER’s multi-impedance socket solution is ideal for high-end FPGA with high-speed interface such as PAM4 and PCIe gen5 or 6....

    • This is solderless spring probe contact which makes stable contact and long life-cycle benefit.
    It is possible to support more than 2000 pin counts, and ideal method for high-pin count device test or verification.
  • Millimeter wave interposer
    This interposer can support DC to 70GHz high-frequency....

    • The B to B connector is solderless and compression mount.

    This has molded plastic body which can make cost saving.

  • 100GHz probe solution
    This high-speed differential solution is ideal for 112Gbps PAM4 device and 6G device evaluation....

    • It is possible to support 100ohm differential but also 90ohm or 85ohm.

  • Multi-channel coaxial cable/KTC connector
    KTC connector is a product that can be utilized to verify the operation performance of IC and evaluation....

    • The connector is solderless, and only with screws.

    It is also ideal for high-speed signal connections between boards.

  • Super short probe
    The super short probe is a low-profile probe with 0.7mm test height....

    • Its short length is possible to have excellent electrical characteristics and can be used for high-speed transmission in the millimeter wave band even if it does not have a coaxial structure. The spring probe configuration has high durability more than 200,000 cycles, and can be used in high and low temperature environments. It is ideal for replacing conductive rubber socket (Elastomer contacts).

    • Probe length 0.9mm (Test height 0.7mm).
    • Support pitch down to 0.5mm.
    • Support high and low temperature environments from -40C to +125C.
    • More than 200,000 life cycles.
    • Suitable for test socket and board-to-board interposers.
    • Available 0.9mm length product with increased travel stroke.
  • Scrab contact probe
    The bias shape of the probe tip can make scrubbing motion on the pad surface during contact....

    • The scrubbing probe motion is possible to maintain stable contact resistance value and break the oxide layer on the pad surface. It is ideal probe option for oxide layer countermeasures in the final test process for QFN, QFP and BGA which have tin plating Pad or Ball package.

Categories

309 Materials, Test
  • Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards)
  • Test Sockets; Contactors and Contact accessories
    • 900 Support Products
  • Tools
    • 902 Other
  • Other
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