Overview
Bristol Nano Dynamics (BND) has developed a world-leading metrology technology capable of imaging nanoscale structures at unprecedented speeds. A spin-out from the University of Bristol, the company has been operating since 2015.
BND’s award-winning Dynamic Scanning Probe Microscope (D-SPM) introduces a new method of imaging nano- and microscale surface features in air and liquids, operating 1000× faster than atomic force microscopes. The company’s benchtop system, Vector, has been deployed by academic institutions in the US, UK, Europe, and South Korea for applications in 2D materials, materials science, genomics, and biosciences.
Following successful technology assessments by two global semiconductor metrology firms, BND has developed and patented a version of D-SPM for measuring nanoscale surface roughness and critical dimensions (CD) on wafers. The D-SPM platform delivers high-throughput nanoscale measurements, capable of producing months to years’ worth of conventional SPM data in a single day. This technology significantly accelerates R&D workflows and paves the way for in-line metrology in semiconductor manufacturing.
Collaboration Opportunities
• Collaborate with semiconductor and metrology industries to co-develop, test, and deploy D-SPM technology in real-world manufacturing environments
• Identify partners to validate performance on advanced-node wafers, adapt the platform for in-line or near-line integration, and co-design application-specific features (e.g., overlay, defect, or CD metrology)
• Seek partners for joint R&D programs supported by UK and international innovation funding bodies