Overview
At SEMICON Taiwan, where we will showcase ELLMID, our localized polishing system designed for semiconductor device sample preparation.
ELLMID is a precision polishing solution that supports failure analysis by enabling targeted layer exposure, reducing the loss of valuable samples, and significantly shortening FIB processing time.
At the exhibition, we will introduce ELLMID’s key features and practical applications, especially for customers facing challenges such as:
- Reducing FIB processing time
- Minimizing variations in sample preparation for failure analysis
- Preserving valuable defective devices for effective analysis
- Shortening lead times for quality assurance and failure analysis workflows