111, Saneop-ro 155beon-gil, Gwonseon-gu
US Office: 4900 Hopyard Rd, Pleasanton, CA 94588
Suwon-si, Gyeonggi-do,  16648

Korea (South)
  • Booth: 5333

Tabletop SEM, 2D/3D X-Ray Inspection and Semi Pkg Systems

Come meet our new North America Distributor - NanoImages, LLC - based in Pleasanton, CA

Offering Live Demonstrations of the SEC SNE-4500M Tabletop Scanning Electron Microscope - the most advanced compact, desktop SEM available.

Information also available on SEC's extensive line of 2D/3D Micro CT and X-Ray Inspection Systems -and- Semiconductor Packaging Systems.

 Press Releases

  • NanoImages brings SEC’s advanced tabletop SEM technology into the US

    (Pleasanton, CA.  June 6, 2017) There’s a new player in the U. S. tabletop electron microscopy market. NanoImages, LLC.  The company was founded by electron microscopy veterans Jon Lechich and Mike Toalson as the exclusive US distributor for advanced yet easy-to-use tabletop scanning electron microscopes (SEMs) made by SEC Co. Ltd. (Suwon, South Korea).  

    Although a new name in the North American market, SEC boasts over a quarter of a century of experience manufacturing electron beam and X-ray inspection equipment for the global market.  To date, they have placed over 1000 X-ray inspection systems world-wide and, since 2006, have installed over 500 tabletop SEMs. 

    As their new US partner, NanoImages offers full service solutions backed by decades of experience in microscopy and analytical techniques. “Imaging is only half the story,” observed NI’s president Lechich. “Today’s labs need quantification and documentation, so our product line includes industry-leading elemental analysis systems from Bruker and EDAX, and MIPAR’s image analysis for particle sizing, pore measurements, and grain structures in metals.”  Rounding out the sample preparation side are sputter coaters, SEM accessories and a TEM adapter for STEM

    Principals Jon Lechich and Mike Toalson carry distinguished pedigrees in microscopy and analysis, including stints at Thermo, FEI, Hitachi, and Ted Pella.  Jon is a graduate of San Jaoquin Delta’s microscopy program and, while with ThermoFisher Scientific in a prior sales role, Mike was the recipient of a Customer Allegiance STAR Award for assistance provided to NASA MSFC during the Space Shuttle’s “Return to Flight” program.

    NanoImages will be conducting live demonstrations of SEC’s high resolution system, the SNE-4500M Tabletop SEM fitted with Bruker’s XFlash 630 EDS at two upcoming meetings:

    • Semicon West (San Francisco, CA, July 11-13,
    • Microscopy & Microanalysis (St. Louis, MO, August 6-10, 

    They will be in SEC’s booth (#5333) at Semicon and (#417) at M&M. 

    For further details on this exciting new US venture, visit and, for information on SEC,


  • SNE series Tabletop Scanning Electron Microscopes
    Full featured Tabletop SEM's featuring capabilities similar to full-size entry level SEM while maintaining superb ease-or-use, robustness and low cost of ownership....

  • Mid-Range and High Resolution Tabletop SEM (Scanning Electron Microscope) systems

    SNE-4500M - A full featured Tabletop SEM with 5-axis stage control for the ultimate in sample positioning. The SNE-4500M is the only tabletop SEM with a variable aperture providing similar resolution to full-size floor model systems.

    The SNE-4500M goes beyond the performance of traditional tabletop SEM’s and is capable of similar functionality of lower end full-size SEM systems.  Having more features than any other Tabletop SEM offers– the SNE-4500M is simply the most advanced compact SEM in its price range.

    SNE-3000 Series - A compact Tabletop SEM with 3-axis stage control and dual imaging detectors (SE/BSE) standard. Low vacuum capability for non-conductive samples is included.  The SNE-3200M is a versatile microscope that can be easily used for Quality Control workflows, Engineering staff and even in Educational environments due to its robust design and easy to learn and use software.

    Advanced options available:
    EDS Elemental Analysis – Cooling Stage – Anti-Vibration table

  • 2D/3D Micro CT and X-Ray Inspection Systems
    A wide portfolio of Micro CT and X-Ray Inspection systems for both off-line (lab) and at-line (production) inspection of Semiconductor, SMT and electronic components....

  • X-Ray Inspection and Micro CT Systems - 16 models such as:

    X-eye NF120 Nano-focus X-ray - Non-destructive analysis system for Wafer Level Packaging
    X-eye SF160 Series 2D & 3D Micro CT System - Non-destructive analysis of semiconductor, SMT, and electronic components
    X-eye 5100 Series Entry-level X-ray Inspection System - Non-destructive analysis of semiconductor, SMT, and electronic components

    X-eye 9000 Series In-Line X-ray Inspection Systemssecondary Battery plate inspection (Angled-shape, circle-shape, pouch-shape)

  • Semiconductor Packaging Systems
    Tab IC Potting Systems and Flip Chip Bonders...

  • TAB IC Potting Systems

    Precise Tape Indexing (Encoder Feedback)

    Stable hardening condition (Heater Zone individual control)

    Needle Auto Calibration

    Flip Chip Bonder

    High-speed, High-precision Linear Motor

    Optimized Vision Image UI

    FPC supply method : Reel or Magazine

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