Freiberg Instruments

Delfterstr. 6
Freiberg,  Saxony  D-09599

Germany
http://www.freiberginstruments.com/
  • Booth: 1428


Freiberg Instruments | Driven by Innovation

Freiberg Instruments is now one of the world's fastest growing, young and dynamic analytical instrumentation companies with products covering a broad spectrum of applications in fields/industries like Crystal Growth & Processing, Semiconductor, Microelectronics, Photovoltaic, Dosimetry, Medical Research, Luminescence Dating, X-ray diffraction, Material Research and Electron Spin Resonance.

Key products: Single Crystal X-ray Diffractometer (XRD), Quartz XRD (Bar, Wafer & Blanks), X-ray Stacking Devices, Electrical Semiconductor Characterization Devices - µPCD/MDP (QSS), bench top and in-field PID testers. 

Freiberg Instruments has taken its commitment to quality to the next level and is now ISO 9001:2008 certified.


 Press Releases

  • Failures of crystalline silicon solar modules under the influence of high voltage have been first reported in 2010. Affected solar cells show an extreme decrease of the shunt resistance. The effect was termed Potential Induced Degradation (PID). Until now, when PID is suspected to develop in PV power plants, the modules have to be dismounted and tests are conducted in certified labratories in a climate chamber. With PIDcheck the test can be performed in the field without any dismounting, with realistic PID test conditions and within few hours (typically 8 h). Hence a lot of money and time can be saved. The PIDcheck has been developed in coorperation with Fraunhofer CSP, Halle, Germany.

    http://www.freiberginstruments.com/pid/pidcheck.html

  • Quartz XRD - Production & Quality Control

    Bar Alignment | Wafer Analysis | Blank Sorting

    Orientations
    AT | SC | IT | TF | X | Y | Z

    Measurement speed: as low as 2 s (AT quartz)
    Highest precision: ≤ 10 arcsec standard deviation
    Spatial resolution: 1 mm ± 0.1 mm

    www.freiberginstruments.com

  • Measurement speed: < 5 seconds per sample, up to 200 times faster than Theta-scan method
    Transfer technology: up to 12 orientated crystals on one slicing beam
    Reliability: uptime > 99 %. Rugged industrial instrument for sophisticated material research and quality control
    Versatility: orientation and polytype determination of SiC (2H, 4H, 6H & 15R) and more than 40 other materials
    Highest precision: angular accuracy of 0.003°
    Modular design: future-proof and customizable with various configuration options

    http://www.freiberginstruments.com/x-ray-diffraction.html


 Products

  • MDPmap
    Mono- and Multi-crystalline wafer lifetime measurement device for sophisticated material research & development...

  • Sensitivity: highest sensitivity for visualization of so far invisible defects and investigations of epitaxial layers
    Measurement speed: < 5 minutes for a 6 inch Si wafer, 1 mm resolution
    Range of lifetimes: 20 ns to several ms
    Contamination determination: metal (Fe) contaminations originated in crucibles and equipment
    Measurement capability: from as-cut wafers to fully processed samples
    Flexibility: fixed measurement head allows coupling of external lasers with trigger
    Reliability: modular and compact bench top instrument for higher reliability and uptime > 99%
    Repeatability: > 99.5%
    Resistivity: resistivity mapping without frequent calibration
  • Omega/Theta (XRD)
    for SiC stacking and quality evaluation...

  • Measurement speed: < 5 seconds per sample, up to 200 times faster than Theta-scan method
    Transfer technology: up to 12 orientated crystals on one slicing beam
    Reliability: uptime > 99 %. Rugged industrial instrument for sophisticated material research and quality control
    Versatility: orientation and polytype determination of SiC (2H, 4H, 6H & 15R) and more than 40 other materials
    Highest precision: angular accuracy of 0.003°
    Modular design: future-proof and customizable with various configuration options
  • Quartz XRD
    Production & Quality Control of Quartz Bars, Wafers and Blanks using X-ray Diffractometer (XRD) Bar Alignment | Wafer Analysis | Blank Sorting Orientations AT | SC | IT | TF | X | Y | Z...

  • Features of Quartz XRD
    Measurement speed: up to 2 s (AT quartz)
    Highest precision: ≤ 10 arcsec standard deviation
    Spatial resolution: 1 mm ± 0.1 mm

    • Determination of orientation inclination relative to the sample
    • Automatic display of angular components (Theta & Phi) including standard deviation
    • German engineering: robust and modular design
    • Software: easy-to-use software suite with multiple user levels. Automatic display, recording and reporting of measurement data
    • X-ray tube: 1.5 kW, Cu anode
    • Power supply: 100 - 230 V, 500 W, single phase

 Additional Info

New Exhibitor:
Yes
New Products:
Yes
Displaying Equipment:
Yes
Product Demonstrations:
Yes
Please indicate which industries/technologies your company serves
Photovoltaic, Semiconductor

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