July 12-14, 2016
San Fransisco, CA
Aehr Test Systems has been a leading producer of test and burn-in equipment since 1977. The company develops, manufactures and sells systems that are designed to reduce the cost of test and perform reliability screening (burn-in) of complex logic and memory integrated circuits (ICs) such as Digital Signal Processors (DSPs), Dynamic Random Access Memories (DRAMs), Flash memories and other ICs. Aehr's systems can be configured for burning-in and testing devices as packaged parts, bare die or full wafer. Aehr Test Systems has over 2,500 systems installed worldwide with offices in the USA, Germany, Japan, and Taiwan.