MARPOSS

3300 CROSS CREEK PKWY
AUBURN HILLS,  MI  48326

United States
http://www.marposs.com
  • Booth: 1665


MARPOSS INTRODUCES IN-PROCESS GAUGE FOR WAFER GRINDING

MARPOSS a world leader in measurement technology and your one partner with many solutions, is focused on improving quality and productivity while reducing manufacturing costs. With years of industry “know-how” we have adapted and created new solutions for the Semiconductor industry. For Semicon West 2019, Marposs is focusing on three main products:  Aeroel Wireline (laser technology), our new IRIX (confocal technology), and our NCG (interferometric technology). 67 years of experience in the manufacturing world has made us the leader in producing groundbreaking quality and process control products, in all fields of manufacturing. To learn more about Marposs’ solutions, visit us at booth # 1665 or our website www.marposs.com. We look forward to seeing you there!


 Press Releases

  • Marposs, a world leader in measurement and process monitoring technologies, will be displaying its Non-Contact Gauge (NCG) for controlling the thickness of different transparent parts, such as glass, plastic or silicon wafers in daily production in booth #1665. The NCG probe can withstand harsh manufacturing processes while being in direct contact with water and residual particles, with the following benefits:

    • Assures a part production within the target tolerance

    • Optimizes the cycle time

    • Assures and maintains a constant and under control productivity

    • Compensates for any production drift

    • Production tracking

    The NCG probe is based on interferometric technology, which causes the phenomenon of interference in order to extract information. In the Marposs gauging solution, light wave trains are emitted from a single source and reflected at the boundary of the object being measured where they combine to cause interference, identifying refractive changes and surface irregularities. The NCG probe enables the layer thickness of transparent materials to be calculated with nanometer precision.

    The use of an infrared light source also enables the measurement of opaque materials with the NCG probe.
     

    Complete information about the NCG in-process controller can be found at www.marposs.com or by contacting Marposs Corp. by phone at (248) 370-0404 or by emailing marposs@us.marposs.com


     
  • Marposs will features its IRIX Confocal non-contact measuring system at SEMICON West in booth #1665.  The IRIX system enables very fast, high resolution distance and thickness gauging of almost any surface including solid, transparent, and polished mirror surfaces such as glass, plastic, or silicon wafers. Featuring a 4mm optical sensor within the measuring probe, the accuracy is extremely precise, enabling the identification of very small aberrations in shape, air gap, or paint finish. 

    The measuring probe placement can be adjusted to achieve very high accuracy. For example, a measuring range of 0,4mm provides 0,055 µm accuracy whereas a measuring range of 12 mm provides about 0,750 µm accuracy. Example applications include:

    • Detection of metal burrs in cell phone holes
    • Measurement of air gaps between two pieces of glass being assembled into a windshield
    • Thickness measurement of transparent finishing paint on a glass surface
    • Diameter measurement of plastic insulin syringe fingers

    Marposs offers the solution with different sensor models and either a DIN rail controller for combination with a PC or a stand-alone unit with an integrated 7-inch display screen. 

    The Confocal Principal
    The Confocal solution is based on the confocal chromatic measuring principle, where white light is split into different spectra using lenses focused on an object through a multi-lens optical system. The lenses are arranged to create and send a chromatically aberrated beam to the target. The target reflects the optical beam back to the probe where it transmits the reflected optical beam to a spectrometer. The reflected optical beam is comprised of rays coming from the outside surface of the object being measured and from the internal surfaces that the beam is able to reach.

    The reflected light intensity is at a maximum for the wavelengths focused on the surfaces. Electronic processing can then determine the intralayer thickness values of the target, or the distance from the probe to the outside surface and to the intralayer surfaces of the target.

    For more information on the Confocal gauging solution, you can download a brochure, contact Marposs by toll-free phone 1-888-627-7677, by e-mail to marposs@us.marposs.com or visit www.marposs.com

  • At SEMICON West in booth #1665, Marposs Corp. will display its Aeroel Wireline laser measuring system designed to monitor the diameter and ovality of steel and copper wire during drawing. Wireline systems are unaffected by wire vibration and speed, providing highly accurate and reliable measurements. A new feature of these systems is a patented dust bracket that protects from soap and iron dust, making it possible to install the gauge on dry drawing benches.

    The Wireline system uses a dual axis laser gauge to check the diameter along two crossed directions (cross-section) of the wire, making it possible to compute the average diameter of the ovalized product. The signals from the laser gauge are then processed by the software, which compares the actual values with the optimal setpoint.  If the wire diameter, due to wearing of the die, exceeds the acceptable tolerance, signals are sent to stop the machine or alert the operator.

    The measured data are displayed on the operator interface panel, which is also used to program the system.  All measurements are recorded and processed to provide a complete statistical report for printing.

    A basic Wireline system consists of a laser gauge pre-loaded with the Wireline.XY software, an operator interface panel in either a 19-in. rack mount or tabletop version and connecting cable.

    For further information about Marposs non-contact laser measuring solutions for wire drawing, call (248) 370-0404 or email marposs@us.marposs.com


 Products

  • IRIX Confocal
    Hi-rez, non-contact system for fast distance/thickness gauging of solid, transparent, mirror surfaces; glass, plastic, silicon wafers. Optical sensor in measuring probe. Extremely precise for ID of small aberrations in shape, air gap, paint finish....

  • The IRIX Confocal system enables very fast, high resolution distance and thickness gauging of almost any surface including solid, transparent, and polished mirror surfaces such as glass, plastic, or silicon wafers. Featuring a 4mm optical sensor within the measuring probe, the accuracy is extremely precise, enabling the identification of very small aberrations in shape, air gap, or paint finish. 

    The measuring probe placement can be adjusted to achieve very high accuracy. For example, a measuring range of 0,4mm provides 0,055 µm accuracy whereas a measuring range of 12 mm provides about 0,750 µm accuracy.

    Marposs offers the solution with different sensor models and either a DIN rail controller for combination with a PC or a stand-alone unit with an integrated 7-inch display screen. 
     
  • Non-Contact In-Process Gauge (NCG)
    In-process gauge controls thickness of transparent parts (glass, plastic or silicon wafers) to assure part production within target tolerance. Withstands harsh manufacturing processes while being in direct contact with water and residual particles....

  • Non-Contact Gauge (NCG) for controlling the thickness of different transparent parts, such as glass, plastic or silicon wafers in daily production. The NCG probe can withstand harsh manufacturing processes while being in direct contact with water and residual particles, with the following benefits:

    • Assures a part production within the target tolerance

    • Optimizes the cycle time

    • Assures and maintains a constant and under control productivity

    • Compensates for any production drift

    • Production tracking

    The NCG probe is based on interferometric technology, which causes the phenomenon of interference in order to extract information. In the Marposs gauging solution, light wave trains are emitted from a single source and reflected at the boundary of the object being measured where they combine to cause interference, identifying refractive changes and surface irregularities. The NCG probe enables the layer thickness of transparent materials to be calculated with nanometer precision.

    The use of an infrared light source also enables the measurement of opaque materials with the NCG probe.
     

  • AEROEL WIRELINE
    WIRELINE is a Laser Measuring System which has been specially designed to be used on-line in the Wire Industry, to monitor the finished diameter and the ovality of drawn wire. ...

  • The Wireline.XY system has been designed for the Wire Industry, to check the wire diameter during drawing, with high accuracy and reliability, as the measurement is unaffected by wire vibration and speed. With a  new and patented dust protective bracket, it is possible to install the gauge on dry drawing benches, where soap and iron dust can strongly affect the measuring accuracy and blind the sensor in a very short period of time.

    The main functions of the Wireline.XY system are:

    • Measurement and display the external diameter and ovality
    • Out-of-tolerance alarms
    • Processing and printing of statistical reports
    • Interfacing with a remote computer

    Advantages:

    • Contactless gauge technology that allows for an entire check of the wire diameter.
    • Reduces labor cost due to continuous monitoring, opposed to hand sampling at the end of each spool.
    • Dust protective bracket for consistent accuracy greatly reducing the negative effects of soap and iron dust.

 Additional Info

New Exhibitor:
No
New Products:
Yes
Displaying Equipment:
Yes
Product Demonstrations:
Yes
Please indicate which industries/technologies your company serves
Other, Semiconductor, Sensors
If you checked Other, please indicate your Company Industry
Measurement technology for Aerospace, Glass, Automotive, Hi-tech, Energy, EV, and Medical

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