July 12-14, 2016
San Fransisco, CA
Nordson SONOSCAN's new Gen7 microscope will be on display.
Nordson SONOSCAN provides reliable non-destructive analysis equipment that reveal hidden internal defects. Our instruments provide test systems for Front, Mid and Back End microelectronics inspection in both the laboratory, as well as full automated factory equipment for scanning wafers, power modules and devices in trays. Our experienced fully staffed regional laboratories offer complete AM analytical inspection services and equipment support in Asia, Europe and the USA. We are the trusted expert in Acoustic Microscopy (AM) with over 40 years of experience.