Pentamaster Trooper-X03 is an innovative wafer level optical test system for VCSEL, EEL, and Laser Diodes, It integrates with LIV test, Far Field test, and Near field test systems.
LIV test analyse the characteristic of optical and electrical corresponding power to eliminate the reject and faulty dice. Far field test analyse for characteristic of projected beam screen the uneven power distribution and hotspot dice. While Near field test enable test to remove reject emitter and M2 measurements. With these test functions in place, tested wafer will ensure only good dice to flow down to the next stage of manufacturing, eliminating waste and safe cost of multiple processes.
Test system is capable to drive current up to 3A at 100us pulse to reduce heats generated from wafer, enable test at high precision and stability. Thermal controller wafer chuck is build in to enable test at low temperature from 5⁰C to raised temperature of 85 ⁰C.
Wafer chuck on X,Y,Z, and Rotation stage is built on top of solid granite platform with anti-vibration system enable stable and reliable thin wafer handling. While load control applied on probe pins ensure ideal test contact established.
Trooper-X03 is a comprehensive all in one tester enable screening at wafer level ensure only good dice to flow down to next phase of manufacturing process, eliminate waste of manufacturing cost, and ensure product excellent quality.