July 12-14, 2016
San Fransisco, CA
Defining Intelligent Microscopy
Clemex offers fully automated solutions using precise positioning tables and microscopes utilizing our own image analysis software to control hardware equipment. With our cutting-edge technology and expertise, we can solve the industry’s most challenging problems such as defect detection in semiconductor wafer inspection. We can inspect many surfaces and validate their integrity using the power of image analysis vision technologies and auto-stage controls. Clemex integrates camera, auto-stage, microscope and other hardware allowing the user to do a fully automated or manual inspection using the Clemex Vision PE image analysis software.