New SEM Streamlines Workflow for Imaging and Analysis
JEOL has increased throughput for imaging and analysis with its new JSM-IT200 Scanning Electron Microscope. New software streamlines workflow with seamless navigation from optical to SEM imaging. The IT200 delivers high resolution imaging with unsurpassed low kV performance, a high sensitivity solid state BSE detector (included with LV models), low vacuum SE detector (optional), and powerful software functionality, including automated image montaging, integrated management of image and analysis data, and automated report generation from all data ranging from collected SEM images to elemental analysis results. The analytical series of this SEM includes JEOL’s fully embedded EDS system which provides real time EDS spectra during image observation. See a demo of the JEOL IT200 SEM in the JEOL booth #6063 N. Hall.