Microtronic, Inc. Contact Us: 1-877-642-7687 |  1-508-627-8951 [email protected]

The Industry’s Most Yield-Enhancing Macro Defect Inspection System
Automated Macro Inspection Platform
EAGLEview
Automated Macro Inspection Platform
No Recipes Needed
Simultaneous Wafer Randomization
Slot Positional Analysis
Integrated Commonality Analysis
Digital Guardbanding
Automated Wafer Sorting
Wafer Backside Inspection
Weigh Cell Monitor
High Throughput (3,000+ WPD)
Reduce Manual Inspection
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The Industry’s Most Yield-Enhancing Macro Defect Inspection System
The Industry’s Most Yield-Enhancing Macro Defect Inspection System
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About Us

Manufacturer of Automated Macro Defect Semiconductor Wafer Inspection, Sorting, and Metrology Equipment

Founded in 1994, Microtronic, Inc. is a U.S.-based, manufacturer and supplier of automated macro defect semiconductor wafer inspection equipment, semiconductor wafer sorters, and semiconductor metrology solutions. Our EagleView brand of automated macro defect wafer inspection systems help semiconductor manufacturers and fabs throughout the world decrease their time to market, optimize defect detection accuracy, and minimize production problems.


Save Time & Money

Discover How To Get A Quicker ROI.

Microtronic’s automated macro defect semiconductor wafer inspection equipment, sorters, and metrology tools are manufactured to support our clients’ business goals, as well as their manufacturing processes. Microtronic semiconductor wafer inspection systems and applications deliver a quicker ROI by more accurately detecting defects at critical points in the semiconductor manufacturing process and at a much higher throughput.  Watch our video to learn more.


Our Products

Leapfrog the Competition

EagleView – Automated Macro Wafer Defect Inspection

Automated Macro Defect Inspection Equipment for Semiconductor Wafers EagleView Automated Macro Defect Wafer Inspection Equipment...

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ProcessGUARD – EagleView Desktop Client

Microtronic ProcessGuard Semiconductor Wafer Defect Inspection Management Software Automate Your Macro Defect Semiconductor Wafer Inspection...

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Trans-Imager

Trans-Imager | Translating process images into significant tool-defect reduction Real-time, tool-specific defectivity data Now there...

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SITEview Software – Defect Review, Images, and Sorting

SITEview Software | Automated Semiconductor Wafer Optical Inspection and Metrology Semiconductor Wafer Defect Review, Image...

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The Industry’s Most Yield-Enhancing

Macro Defect Inspection System

EagleView 5
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ProcessGuard Software
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EAGLEview Skipping Manual Inspection
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EAGLEview External Microview
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EAGLEview Internal Microview
Download
EAGLEview CMP Residual ADC
Download
ProcessGuard Xtensis
Download
Trans-Imager
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Defect Library

See What You Cannot See

Reticle Tilt Defect

Reticle Tilt Defect EagleView easily spots reticle tilt semiconductor wafer defects which may look similar...

Spin Defect – Line

Spin Defect – Line Example of single line spin macro defect detected by EAGLEview. This...

Spin Defect – Entire Wafer

Spin Defect – Entire Wafer This is a spin or coat macro defect which covers...

Spin Defect on Edge

 Spin Defect on Edge Spin Defect on the edge of the semiconductor wafer is a...

Center Spin Macro Defect

Center Spin Macro Defect Spin defects can occur anywhere on the wafer or throughout the...

Accurately Detect Defects at Critical Points

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Latest News

Solid State Update

Connect with Microtronic at Semicon Europa

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Microtronic Announces the EAGLEview model EV6 Macro Inspection Platform

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Microtronic Announces an Automated Backside Macro Inspection for the EAGLEview Platform

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Microtronic Announces Methodology for Reducing or Eliminating Manual Microscope Inspection during the Post Pandemic Labor Shortage

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Microtronic Announces Real-time Macro Defect Monitoring – Within Semiconductor Processing Equipment

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Microtronic Announces New Informational Tech Bulletin Series on Optimizing Semiconductor Macro Defect Wafer Inspection

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Contact Us Today

Microtronic, Inc.

1-877-642-7687   |  1-508-627-8951

[email protected]

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