July 12-14, 2016
San Fransisco, CA
See our Woollam M-2000 ellipsometer in action at booth 728.
Ellipsometers for measurement of thin film coatings, including film thickness and optical properties. Measurements are non-contact and non-destructive using polarized light. Woollam Company provides equipment for use in both R&D and production environments. Measurement services are also available.
Contact firstname.lastname@example.org and www.jawoollam.com for more information.
SEMI Global Headquarters
673 South Milpitas Blvd.
Milpitas, CA 95035
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