July 12-14, 2016
San Fransisco, CA
Microtronic’s EagleView- Auto Macro Defect Inspection System
All facets of the semiconductor industry are feeling the pressure brought on by the increasing demands of current and future technologies. Moore’s law is no longer the driving factor; reliability is becoming the most important factor for critical systems such as AI, VR, and automotive. The existing paradigm of limited sampling and over reliance on end of line testing is no longer sufficient. Microtronic’s EagleView systems provide100% inline machine-vision inspection and defect detection and help fill the gaps left by typical inspection methodologies.
EagleView improves a fab’s yield and reliability – without device dependent recipes or sampling – at a rate of approximately 3000+ wpd. And EagleView can inspect any wafer substrate. Microtronic’s EagleView systems, which have inspected 100s of millions of wafers throughout the world – take the guesswork out of defect inspection. Product winner Best of West 2017 for best new product at Semicon. Visit us for a live demo and meet the team.
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