July 12-14, 2016
San Fransisco, CA
JEOL provides leading-edge electron microscopy and e-beam lithography solutions for 200/300mm, nano-fabrication processes and research.
JEOL’s microscopy expertise spans more than 70 years. As the leading global supplier, we offer a full suite of Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), and sample preparation tools. JEOL’s SEMs and TEMs feature advanced automation and capabilities for high throughput, high resolution imaging and analysis. JEOL offers both focused (FIB) and broad ion beam milling systems. Our Cross Section Polisher features air-isolated transfer and cooling for sensitive samples.
As the industry leader in direct write e-beam lithography, JEOL’s latest generation of tools will take you through several next-generation designs. JEOL has more than 50 years of experience in e-beam and mask writing tools.
Service and Support
JEOL USA is a wholly-owned subsidiary that supports the Americas with regional service offices and headquarters in the Boston area.