• Booth: 727

Discover our Magnetic ATEs to test MRAM and Magnetic Sensors

Hprobe designs and manufactures Automatic Test Equipment (ATE) for wafer-level testing of magnetic memory devices (MRAM) and magnetic sensors (xMR).

Hprobe has unique patented technologies of multidimensional magnetic field generators with excellent magnetic field sweep speed and high field strength.

The electrical probing can generate any pattern of 3D magnetic field.

Thanks to their high-speed testing capabilities on 200/300mm wafers, the IBEX testers boost performance and accelerate spintronics developments!

Hprobe is headquartered in Grenoble, France, with a subsidiary located in Germany and a subsidiary located in USA.

Hprobe is represented by Distributors in Taiwan, China, Singapore and Korea.

Over the past 4 years, Hprobe has installed magnetic testers in France, Belgium, Germany, Taiwan, China, Korea and USA, with local distributors and engineering support.


  • High-Performances Magnetic ATE
    Automated Test Equipment with 3D Magnetic Generator...

  • Ultra-Fast Magnetic Automated Testers for wafer-level probing of Magnetic Devices - MRAM (STT, SOT, VCMA) & Magnetic Sensors (TMR, GMR, AMR, Hall)
    o    MRAM - IBEX-WAT for Wafer Acceptance Test
    o    MRAM - IBEX-WS for Wafer Sort
    o    Magnetic Sensors - LINX-WS for Wafer Sort

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