July 12-14, 2016
San Fransisco, CA
See our Woollam M-2000 ellipsometer in action at booth 728.
Ellipsometers for measurement of thin film coatings, including film thickness and optical properties. Measurements are non-contact and non-destructive using polarized light. Woollam Company provides equipment for use in both R&D and production environments. Measurement services are also available.
Contact email@example.com and www.jawoollam.com for more information.