962 Terra Bella Ave
San Jose,  CA  95125

United States
  • Booth: 130

Welcome to cyberTECHNOLOGIES' home base Semicon West 2014!

cyberTECHNOLOGIES is a leading provider of high resolution and fast 3D Optical Metrology Systems for non-destructive process control of surface topography, film thickness, roughness and quality inspection as well as Total Thickness Variation (TTV) of Semiconductor Wafers, Via Depth, Probe Cards, Glass Products, MEMS, Solar Cells, Fuel Cells, Printed or Jetted Products, Chip Packages, Medical Devices and many other devices.

Our systems reliably measure on absorbent, highly reflective, soft or transparent materials with high vertical and lateral resolution down to sub-nm, even over large areas of interest and with large measurement ranges, from sub-nanometers to several millimeters.

Our In-house software development provides our customers with an easy-to-use system that provides superior automation capabilities, high speed, accuracy, comprehensive data analysis capabilities in R&D and production in industries as varied as medical devices, semiconductors, solar, hybrid, MEMS, automotive, pharmaceutical as well as optics manufacturing.

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