Roos Instruments, Inc.

2285 Martin Ave
Santa Clara,  CA  95050-2715

United States
https://roos.com

• Booth: 365

Use Cassini ATE platform to solve your testing needs!

For over thirty years, Roos Instruments has been delivering the industry’s premier end-to-end production RF test solution. Our Cassini ATE platforms offer the highest-in-class RF performance for consumer and industrial-grade devices that demand exacting standards of precision. Designed with a completely modular architecture, Cassini marries versatility and capability in a system that scales vertically to meet performance benchmarks and horizontally to capture emerging markets. With the widest instrument coverage available, we offer application configurations ranging from high-power RFICs to mmWave automotive radar. Combined with intuitive test software, enterprise management tools, and the engineering expertise to bring it all together, with Roos Instruments you're ready tackle today’s test needs and the next generation of technology.

 Press Releases

• High-Power Production Test for Base Station Power Transistors (20210816)

  June 14, 2021 Roos Instruments, Santa Clara, Calif

  Sub-6 GHz base station power amplifiers (PAs) use one of two competing technologies: Si LDMOS or GaN. As the frequency and power efficiency requirements for 5G push LDMOS technology to its limits, GaN is slated to surpass LDMOS as the dominant choice for future base station PAs. The higher power density, better operating efficiency, smaller size, faster switching speed and higher frequency coverage will make GaN the preferred PA technology for sub-6 GHz 5G.

  GaN’s capability and performance improvements bring new characterization and test requirements to ensure specification compliance and reliability. To meet these requirements, Roos Instruments has added the RI8589 High Power Supply/Pulser to its modular Cassini ATE platform. Designed for LDMOS and GaN testing, the RI8589 is an all-in-one solution for power device characterization. It provides multiple high voltage supplies from -60 to +180 V, a pulsed supply capable of delivering 1 kW with microsecond measurement capability and precision microamp current measurement. Other features of the RI8589 include dynamic on-resistance (Rdson) and pulse profile measurements, temperature characterization, switching between high voltage and high current measurements without re-cabling and built-in safety interlocks.

  The RI8589 High Power Supply/Pulser is an add-on test capability to the modular Cassini ATE platform, enabling users to customize ATE measurements to specific device needs, with the capability to adapt to future requirements. Combined with high-power microwave instruments and configurable device interfacing, Cassini ATE is an all-in-one solution for power device characterization and production test.

  Roos Instruments, Inc.
  Santa Clara, Calif.
  roos.com

• "New Data Format Boosts Test Analytics" Semiconductor Engineering Article (20210816)

  "Demand for more and better data for test is driving a major standards effort, paving the way for one of most significant changes in data formats in years.

  There is good reason for this shift. Data from device testing is becoming a critical element in test program decisions regarding limits and flows. This is true for everything from automotive and medical components to complex, heterogeneous devices such as processors used in servers or smart phones. And increasingly, all of these devices are expected to function flawlessly for longer periods of time, which can be more than a decade for automotive, industrial, and medical applications.

  Test and data analytics vendors have developed a variety of different approaches to ensuring quality, ranging from outlier detection techniques involving dynamic part average testing (DPAT) to on-chip monitoring throughout a chip’s lifetime. The big problem today is in the data itself. Implementing complex test processes with the Standard Test Data Format (STDF) is becoming unwieldy. There is simply too much data from too many sources.

  This is why SEMI and its member companies are developing the Rich Interactive Test database (RITdb), a proposed test data standard aimed at reducing the burden for test engineers and test operations. RITdb, which is the work of SEMI’s Collaborative Alliance for Semiconductor Test (CAST) RITdb working group, focused on the scope of test data and test processes required for modern devices and contemporary test process. Their efforts will be voted on later this year."

  Learn More>> https://semiengineering.com/new-data-format-boosts-test-analytics/

  September 8th, 2020 - By: Anne Meixner

• Roos Instruments Relases RI8607 Test Set (20210816)

  As the ATE industry tackles the new paradigms of 5G millimeter wave test, our 30 years of experience working closely with
  customers at these frequencies has highlighted the need for a holistic production test solution.

  The RI8607 Test Set is our newest instrument offering for the Cassini ATE system with 2-port source and measure capability
  from 4 GHz to 50 GHz. The RI8607 provides drop-in frequency extension of our standard 25 GHz source and receiver
  instruments, supplying vector-error corrected VNA capability and two-tone intermodulation test with a single insertion.
  Coupled with our novel modular device interface, this enables configurable and cost-effective measurement port expansion
  that’s integrated into the instrument software control and system calibration to allow vector error-correction all the way to the
  device under test. Incorporating our patented RR12 Micro Flange™ interfaces and conformable waveguide interconnect, our
  test systems deliver high-density millimeter wave to probe card or socketed ICs with 10x less signal loss than coaxial to
  provide the industry’s most capable and versatile test solution to tackle the next generation of high frequency 5G test
  requirements.

  Introduced in 2005, the Cassini ATE platform offers a completely configurable test architecture, providing the industry's widest
  measurement range spanning from DC and high-speed digital to 110 GHz. Combined with an intuitive graphical programming
  environment, Cassini offers precision measurement capability in a rapid production test development environment.
  Roos Instruments is a company based in Santa Clara, CA that designs and manufactures Automatic Test Equipment (ATE) for
  the semiconductor industry. Founded in 1989 from a DARPA Small Business Innovation Research (SBIR) grant, the company
  specializes in mixed-signal, microwave, and millimeter wave test of precision consumer and industrial-grade integrated
  circuits.

  Learn More>>

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