Loading...

MARPOSS

AUBURN HILLS,  MI 
United States
http://www.marposs.com
  • Booth: 1733

Welcome to Marposs' listing for Semicon West 2023!

Overview

MARPOSS a world leader in measurement technology and your one partner with many solutions is focused on improving quality and productivity while reducing manufacturing costs. With years of industry “know-how,” we have adapted and created new solutions for the Semiconductor industry. For Semicon West 2023, Marposs is focusing on three main products: OptoSmart, our STIL product line, and our interferometric technology. 70 years of experience in the manufacturing world has made us the leader in producing groundbreaking quality and process control products, in all fields of manufacturing. To learn more about Marposs’ solutions, visit us at booth #1733 or our website www.marposs.com. We look forward to seeing you there!


  Press Releases

  • Marposs, the world leader in measurement and process monitoring technologies, will demonstrate its P3IFIR for measuring wafer thickness at this year’s SEMICON West Convention in booth #1733. A replacement for traditional non-contact gauging (NCG), the P3IFIR combines the company’s P3 in-process amplifier line (commonly used in back grinding, lapping and CMP operations) with an interferometric (IF) probe for robust in-process measurement capabilities.

    Precisely measuring and controlling the thinning process in semiconductor manufacturing is critical for several reasons. For example, the characteristics of a semiconductor device are significantly affected by the thickness of its various layers. Any deviation can alter its electrical characteristics, affecting the performance of the integrated circuit (IC) where the device is located. Further, any inconsistencies can lead to defects that reduce manufacturing yield, costs, and lead time.

    The gauge uses interferometric technology where light sources are reflected off the surface boundary of the measured object and combined to cause interference. Users are then able to identify the layer dimension, which optimizes the overall measurement of a specific material. 

    For more information about Marposs’ solutions for the semiconductor industry, visit https://www.marposs.com/eng/application/electronic-industry-silicon-wafer, call (248) 370-0404 or email [email protected]

    END

    Contact information:
    Industry-Scope (agency)
    Nancy Lesinski
    [email protected]
    248-709-3040

  • Marposs, a world leader in measurement and process monitoring technologies, will be displaying its Ball Grid Array (BGA) inspection solution using a Solarius Phoenix workstation at this year’s this year’s SEMICON West Convention in booth #1733. The BGA system utilizes the company’s Chromaline MPLS Controller and WireView non-contact line sensor head—together with newly-developed NanoView technology—for fast, accurate measurement of the distance and thickness of the various “bumps”, ensuring they meet target requirements.

    A type of surface-mount packaging used for integrated circuits, BGA packages are used to permanently mount devices such as microprocessors and graphics chips. They provide a large number of interconnection points in a small space, which simplifies the task of connecting the device to the rest of the system, but fast, accurate inspection of these connections is critical.

    The Chromaline system, utilizing chromatic confocal technology, is the optimal solution to produce high-accuracy bump measurements, verifying correct placement and geometry of these crucial mounting positions. The system is easy to use and has proven to be both reliable and durable, without concerns over reflectivity or poor lighting conditions.  It can gather to 360,000 measured points/second and capable of identifying the most subtle variation in shape with high resolution and linear error of only 0.1 μm. It can work with frequencies up to 2 kHz in standard mode, and even 6 kHz with a reduced sensor measuring range.

    The Confocal Principal
    With chromatic confocal technology, white light is split into different spectra using lenses focused on an object through a multi-lens optical system. The lenses are arranged to create and send a chromatically aberrated beam to the target. The target reflects the optical beam back to the probe where it transmits the reflected optical beam to a spectrometer. The reflected optical beam is comprised of rays coming from the outside surface of the object being measured and from the internal surfaces that the beam is able to reach.

    The reflected light intensity is at a maximum for the wavelengths focused on the surfaces. Electronic processing can then determine the intralayer thickness values of the target, or the distance from the probe to the outside surface and to the intralayer surfaces of the target.

    Complete information about the  Chromaline MPLS can be found at https://www.marposs.com/eng/product/chromaline-sensor or by contacting Marposs Corp. at (248) 370-0404 or emailing [email protected]

    -- End –

    Contact Information
    Industry-Scope (Agency)
    Nancy Lesinski
    [email protected]
    248-709-3040

  • MEDIA RELEASE

    Marposs Acquires Solarius And Strengthens Its Semiconductor And Consumer Electronics Segment

    The Silicon Valley based company Solarius becomes part of the Marposs Group, strengthening the technology of the Italian multinational company in the semiconductor industry

    San Francisco, Calif. and Bentivoglio (BOLOGNA), July 11, 2023At Semicon West 2023, Marposs, the world leader in measurement and process monitoring technologies, announces the acquisition of Solarius Development, a leading provider of high-tech manufacturing solutions for the Consumer Electronics and Semiconductor Industry. Both segments are of strategic importance for Marposs growth and diversification.

    Established 22 years ago and with headquarters in the California Silicon Valley, Solarius has a strong presence in the USA and Asia; namely China, Korea, Vietnam, Singapore, Malaysia and Taiwan. Solarius also inaugurated a Technology Center in Germany in 2018, dedicated to the Research and Development of control systems for the production of semiconductors.

    It has recorded sales of more than US $12 million in 2022 with solid profitability and returns and employs around 26 people within the USA (Silicon Valley), China (Shanghai), Germany (Munich and Essen).

    Solarius provides engineering, application and manufacturing expertise covering the entire lifecycle from design to installation, commissioning, training, application support, repair and maintenance of precision systems for non-contact surface inspection, measurement, analysis and visualization. Its solutions combine high-resolution sensors with automated data acquisition systems and powerful analysis software tools. Key applications include electronic devices (smartphones, tablets, smartwatches), semiconductors and energy fuel cells.

    As part of the Marposs Group, Solarius will gain access to a worldwide distribution network and greater availability of resources and technologies, ensuring greater solidity and growth opportunities.

    Marposs Group, already a world leader in measurement, inspection and testing solutions for the production environment, continues its M&A strategy by exceeding 30 acquisition operations. Marposs has been present in the USA since 1963 and has had an operating office in Silicon Valley for over twenty years. The Group is already a supplier for companies that produce semiconductors with grinding systems for silicon wafers and enclosures for smartphones.

    With the purchase of Solarius, Marposs further expands its range of solutions for optical measurement into other phases of the production process including the “back-end” phase. In particular, it offers solutions for customers operating in the consumer electronics, green energy and in the semiconductor sector, an industry that is in constant growth, due to its fundamental role in the digital technological evolution and towards e-mobility.

    “This operation is perfectly in line with our Group strategy,” stated Stefano Possati, President of the Marposs Group. “Thanks to its position in Silicon Valley, the level of technology and the talent of the whole team, Solarius has developed very important synergies with large companies operating in the electronic devices and information technology industry, already working at co-design and prototyping phases. We intend to support the growth of Solarius with our resources and our experience because it is a company with excellent prospects.”

    Commented Peter Joshua, President of Solarius Development Inc., “Solarius has long been at the forefront of implementing new and emerging technologies targeted at providing unique solutions to ever demanding metrology challenges. Joining the Marposs Group is the next step in the evolution of the company; the combination of engineering talent and international resources will significantly strengthen the solutions and systems we will be able to provide to our customers. We are looking forward to contributing to the growth of the Marposs Group in both existing and new strategic markets.”

     

    Marposs

    MARPOSS was founded in 1952 and Mr. Stefano Possati is the President of the Group; it provides shop-floor solutions for quality control in the production environment. Marposs’ solutions include gauging equipment of mechanical components, before, during and after the production process; monitoring solutions on machine tools; assembly and testing for many industry sectors; and automatic machines and inspection stations for production lines. MARPOSS is one of the main suppliers to the automotive industry supporting the transition to e-mobility, but additionally operates in the aerospace, biomedical, hi-tech, appliance and glass containers industries. MARPOSS Group employs 3500 people around the world and is present in 34 countries with more than 80 sales offices.

    Ufficio Comunicazione Marposs

    Mariangela Bettini | [email protected] –  + 39 346 822 9777


  Products

  • MPLS-DM SERIES - CHROMALINE SENSOR
    Based on STIL's chromatic confocal technology, ChromaLine sensor family represents the next step in industrial integration. Thanks to its accuracy, its robustness and a life span of several years without any maintenance, MPLS sensors are adapted to the...

  • Thanks to its accuracy, its robustness and a life span of several years without any maintenance, MPLS sensors are adapted to the requirements of on-line control. With 180 measuring points aligned along a line ranging from 1 to 12 millimeters, the new MPLS-DM version enables high-quality inspection with new capabilities, and working frequencies up to 2kHz in standard mode, and even 6kHz with a reduced sensor measuring range.

    Benefits include:

    • Versatile: measures any material capable of reflecting white light (e.g. metal, glass, plastic, paint films, liquids)

    • Industrial thanks to its optical head made exclusively of passive components

    • Up to 360,000 measured points/second allows to work in all industries in standard 2Klines/second

    • More than 1 million points/second are acquired on dedicated applications at 6Klines / second

    • Distance and thickness measurements

    • High measurement accuracy

    • Availability of SDK and protocol commands for easy integration into any system

    • Synchronized measurement with encoder for dynamic acquisitions

    • Ethernet communication

  • ZENITH CONTROLLER FOR NON-CONTACT MEASUREMENT
    Working with a variety of STIL chromatic confocal sensor heads, the Zenith produces profiles with very high slope profiles and measurement down to the nanometer. High-frequency sampling rates. Ethernet communication....

  • Marposs' Zenith non-contact controller, based on chromatic confocal technology, allows very high-resolution measurement on all types of surfaces and materials including reflective, transparent, opaque, bright or diffuse. The Zenith is designed to be robust and reliable, making it suited for measuring parts in industrial and lab environments for a variety of industries including micromechanics, watchmaking, robotics, medical, semi-conductor, electronics, batteries, glass, etc.

    The Zenith controller features a new generation of components in combination with a variety of STIL chromatic confocal optical sensor heads, producing profiles with very high slope angles and allowing the measurement down to the nanometer. The high-frequency sampling rate makes Zenith ideal for dynamic applications in combination with up to five linear encoders for external measurement synchronization that can pair well with CMMs.

    The Zenith uses Ethernet communication and is integrated into machines using a simple SDK or proprietary protocol command. With a measuring frequency range of 400 Hz - 5000 Hz, it has the ability to save up to 20 maps, allowing use of the most appropriate probe. The Zenith unit measures 169mm x 110mm x 88mm (6.65” x 4.33” x 3.46”).

    Information on the Zenith controller can be found at Zenith: Your New Reference For Chromatic Confocal Controllers (marposs.com), by calling (248) 370-0404 or by emailing [email protected]

  • IRIX CONTROLLER FOR MEASURING THIN LAYERS
    IRIX™ measures up to five layers of material simultaneously. It can be used with a large family of optical probes with different measurement ranges, mechanical dimensions and metrological specifications....

  • Marposs, the world leader in measurement and process monitoring technologies, will display its IRIX-IF for measuring thin layers on semiconductor wafers at this year’s SEMICON West Convention in booth #1733. The IRIX-IF system utilizes Marposs’ universal and versatile IRIX controller with an integrated display unit and white light interferometry to deliver precise thickness measurements in multiple applications and on any surface reflectivity, whether transparent, opaque, shiny or light diffusing.

    Precisely measuring and controlling thin layers in semiconductor manufacturing is critical for several reasons. For example, the characteristics of a semiconductor device are significantly affected by the thickness of its various layers. Any deviation can alter its electrical characteristics, affecting the performance of the integrated circuit (IC) where the device is located. Further, any inconsistencies can lead to defects that reduce manufacturing yield, costs, and lead time.

    White light interferometry has proven to be a fast, accurate way to measure layer thickness. It is non-contact, offers high resolution and accuracy, and is extremely fast. White light interferometry also provides information about the layer’s surface topography, including roughness, waviness, and step heights. These advantages make the IRIX-IF an ideal choice for precise layer thickness measurements in semiconductor manufacturing.

    Complete information about the IRIX-IF can be found at https://www.stil-sensors.com/eng/product/chromatic-confocal-technology or by contacting Marposs Corp. at (248) 370-0404 or emailing [email protected]


Send Email

Type your information and click "Send Email" to send an email to this exhibitor. To return to the previous screen without saving, click "Reset".