Bowman Analytics

Schaumburg,  IL 
United States
https://bowmanxrf.com/

• Booth: 1928

Overview

Bowman introduces ARCHER™, the most important software development in a decade for users of XRF analyzers.  ARCHER allows 1 instrument to provide precise coating thickness, composition and solution analysis. Software yields precise results regardless of the variable density that occurs over the bath’s life. Bowman instruments are IPC4552 A/B capable, and are best available XRF technology for ENIG/ENEPIG, HASL, %P. Bowman's 8 XRFs measure up to 5 layers; all have Silicon Drift Detectors for maximum peak resolution and shorter measurement times. “W” Series Micro XRF and (new!) cleanroom-ready A Series use poly-capillary optics to focus the beam to 7.5 µm FWHM -world’s smallest beam size for coating thickness analysis using XRF; ASTM B568, DIN 50987, ISO 3497, SEMI S8. “P” Series was engineered for large PCBs and flat panels; available with Large Window SDD. Multiple stage options accommodate widest range of sample sizes. Local support: service, recertifications, reference standards.  

  Press Releases

• XRF Coating Measurement System Measures the Widest Range of Product Sizes, Meets IPC 4552, Rev. A (Apr 17, 2023)

  Who Benefits? 

  • Manufacturers who test a wide variety of sample sizes OR multiple locations per new lot of material

  • Finishers who want an XRF measurement system that does "triple duty" - performing coating analysis, solution analysis and element analysis with one instrument

  • Finishers who need to comply with the newest IPC specification, 4552-A, for printed circuit board plating

  Bowman, a US manufacturer and global service provider for XRF coating measurement instruments, has introduced its P Series, a versatile benchtop XRF instrument. 

  Bowman’s P Series simultaneously identifies elements (Al¹³ through U⁹²  on the periodic table) in each of up to 5 coating layers, with exceptional precision and speed.  It is ideal for test environments with high throughput schedules. 

  Standard system configurations include a 4-position collimator assembly, variable focus camera for applications with recessed areas, extended-life

  micro-focus X-ray tube and solid state PIN detector.  The detector has well-defined element peaks, eliminating the need for secondary filters. Minimal peak position drift assures highest stability over time and extends the interval between recalibrations.  An SDD detector is also available.  

  Unique to Bowman XRF instruments is the intimate proximity of the X-ray tube and detector, a feature of system architecture that produces more than three times the photon counts of conventional XRF equipment - and in a shorter measurement time.

  The Bowman P Series has an extended programmable XY axis that makes it suitable for measuring small features, or parts such as fasteners, connectors, and PCBs. Table size is 25” X 25”; travel is 10” X 10”.   It is ideally suited to shops that want to prevent their two costliest issues: rejections from under-plating, and material waste from over-plating. 

  The P Series is the 6^th model in Bowman’s comprehensive suite of XRF instruments.  Like other instruments in the portfolio, it runs advanced Xralizer software to quantify coating thickness from the detected photons.  Xralizer software combines intuitive visual controls with time-saving shortcuts, extensive search capability, and "one-click" reporting.  The software also simplifies user creation of new applications.

  Bowman is a leading manufacturer of precision XRF coating measurement systems, with a robust local service network that provides same-day response for every XRF requirement, worldwide.  Equipment evaluation, selection, commissioning, maintenance and modernization is provided for users of all Bowman instruments, as well as other XRF brands.  All Bowman systems are manufactured in the USA.

• Micro XRF Measures Smallest Features in Wafers, Microelectronics (Jun 13, 2023)

  Bowman has introduced an important addition to its suite of precision XRF instruments used in the PCB, semiconductor and microelectronics industries.

  The Bowman A Series Micro XRF quickly measures the smallest features on semiconductors and microelectronics. It accommodates very large PCB panels, and wafers of any size, for full sample coverage and multi-point programmable automation.

  Poly-capillary optics focus the X-ray beam to 7.5 µm FWHM, the world’s smallest for XRF coating thickness analysis. A 140X magnification camera measures features on that scale; a secondary, low magnification camera provides live-viewing of samples and “birds-eye” macro-view imaging. Bowman’s proprietary dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and quickly identify the feature of interest.

  A programmable X-Y stage with movement of 23.6 in (600 mm) in each direction can handle the largest samples in the industry. The stage has precision down to +/- 1 µm for each axis, and is used to select and measure multiple points; Bowman pattern recognition software and auto-focus features also do this automatically. The system’s 3D mapping capability can be used to view the topography of ENIG, ENEPIG, EPIG and other elite processes.

  A Series instruments include 7.5 µm optics with molybdenum anode tube (chromium and tungsten also available) and a high-resolution, large-window Silicon Drift Detector (SDD) which processes more than 2 million counts per second. SDDs are the standard, industry-wide, for complex thin films. The high count rate capability is key to achieving a low minimum detection limit (MDL) and highest spectral resolution.

  A Series systems are distinctive in that they are cleanroom-ready, have the largest semiconductor stage movement on the market, and are supported worldwide by a service network that provides same-day response for every benchtop XRF requirement. Equipment evaluation, selection, commissioning, maintenance and modernization is available for users of Bowman instruments, as well as other major XRF brands.