HON. PRECISION, INC.

Taichung,  Taiwan
https://www.honprec.com/en/
  • Booth: 5455

Overview

Since the company's establishment, Hon Precision, Inc.(HPI) has had Partnerships with worldwide OSAT and IDM customers working together and has enabled us to become a leading handler manufacturer in the global semiconductor industry.

Our vision is to become a top-class semiconductor company by delivering top-notch products and services.  

In tune with the motto “Customer First, Quality First”, our clients can maintain trust and confidence in our products and our support. To achieve a win-win, Hon Precision, Inc. not only brings optimum overall equipment performance to every client but also enables equipment to secure the highest possible market acceptance.

  Products

  • Dual-Temp Test Handler
    The HPI Dual-Temp Test Handler is a high-productivity and reliable IC test handler for the package in ambient and hot conditions. The Handler offers multiple test sites up to 32 in parallel in order to reach high throughput....

    • FT : HT-9000 | HT-7000 Series
    SLT: HT-30XX Series
    (Optional ATC)

    Active Thermal Control (ATC) System

    - 100% self-development
    - Support extremely high power (1000W / 2000W)
    - Multiple cooling solutions ( Air / Liquid / Refrigerant )

    Large / Small Package Support

    It is compatible with various semiconductor devices and packages, with sizes ranging from 2mm x 2mm to 150mm x 150mm

    Multiple Test Sites

    It can support multiple test sites and can run multiple tests in parallel, which increases testing throughput and efficiency.

    Vision

    -  Compatible Real-time Camera(RTC) for piggyback
    - 2D Code Scanning
    - Optical Character Recognition(CCR)

    Customized Design

    One-Stop Shop to meet customer test requirements. Professional Handler House compliance with semiconductor testing needs.

  • Tri-Temp ATC Test Handler
    A tri-temp test FT/SLT handler is a type of equipment used in semiconductor manufacturing and testing to test devices under different temperature conditions....

    • Capabiliy : -55°C ~ 175°C
    FT: HT-10XX Series
    SLT: HT-30XXCT Series

    A tri-temp test FT/SLT handler is a type of equipment used in semiconductor manufacturing and testing to test devices under different temperature conditions. It is typically used in conjunction with a tester to automate the process of testing and sorting semiconductor devices based on their performance at different temperature ranges.

    Temperature control

    The handler is equipped with a temperature control system that allows it to maintain precise temperature conditions within a specific range, typically from -55°C to 175°C. This is essential for testing the performance of devices under different temperature conditions.

    Active thermal control (ATC) System

    HON. PREC ATC system maintains device performance through balanced temperature control, achieved by a chiller/refrigerator/air unit and a heater unit. It uses cost-effective refrigerators instead of LN2 technology and provides individualized heating and cooling.

  • Active Thermal Control (ATC) system
    Active Thermal Control (ATC) system is designed to control the temperature of the device under test (DUT) during testing....

    • ATC2 series / ATC3 series (Water Chiller)
    ATC5 series (Refrigerant)
    ATC6 series / ATC7 series(Air Cooling)

    Active Thermal Control (ATC) system is designed to control the temperature of the device under test (DUT) during testing. 

    Junction Temp. (TJ) features. 

    ATC is capable of High power heat dissipation for 1000~2000W ICs.

    Water Cooling (ATC 3 series)

    Water cooling uses a liquid coolant to absorb heat

    Refrigerant Cooling (ATC 5 series)

    Refrigerant cooling uses a refrigeration system to remove the heat from the DUT

    Air Cooling (ATC 6 series)

    Air cooling uses a forced air stream to dissipate heat.

Categories

1 FLEX
  • Inspection & Test
    • 100 Electronic System Design
  • Test Tools and Services
    • 208 Test Equipment
  • Handlers; Positioner Systems
  • Linear Test Systems
  • Logic Test Systems
  • Memory Test Systems
  • Optical Test Systems
  • Package Test Systems
  • Parametric Test Systems
  • System on a Chip (SOC); Mixed Signal Test Systems
  • Test Contactor Cleaning; Conditioning Systems
  • Test Head Manipulators and Docking Stations
  • Wireless, non-contact Test Systems
    • 309 Test Materials
  • Boards: Burn-In; Performance (Low/High Temp and Ceramic)
  • Structural Circuits; Test; Thermal Fixturing
  • Test Sockets; Contactors and Contact accessories
    • 701 Manufacturing Services or Consulting
  • Static; ESD Testing & Control Services
  • Test Services or Consulting

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