TT Vision Technologies SDN BHD

F4X offers a dual vision inspection module in the machine while F241 offers a single vision inspection module.

F4X/F241 involves the use of specialized equipment and imaging systems to capture high-resolution images of the wire bonds. These images are then analysed and compared against predetermined standards or specifications to detect any defects or deviations.

F4X/F241 typically utilizes advanced algorithms and image processing techniques to identify issues such as missing, misaligned, or damaged wire bonds. It can detect anomalies in bond length, loop height, wire position, or other parameters that may affect the performance or reliability of the electronic component.

F4X/F241 can inspect a range of wire materials including gold, copper, CuPd, silver, and aluminium, with fine wire diameters starting at a minimum of 0.6 mils and heavy wire diameters extending up to a maximum of 20 mils. The inspection also includes various bond types such as ball, stitch, and wedge bonds.

F2X, an automated wafer inspection machine is a specialized equipment used in the semiconductor industry to inspect and evaluate the quality of wafers. Wafers are thin slices of semiconductor material on which integrated circuits and other microdevices are fabricated.

F2X involves the use of specialized equipment and imaging systems to capture high-resolution images of the wafer surface. These images are then analysed using advanced algorithms and image processing techniques to detect and identify various types of defects or abnormalities.

F2X can detect a wide range of defects, including particles, scratches, pattern variations, and circuitry issues. It enables rapid and accurate inspection of the entire wafer surface, helping to ensure the quality and reliability of the integrated circuits and other microdevices fabricated on the wafer.

F2X is featuring an advanced top camera module consisting of an imaging camera system with a high precision auto lens changer, brightfield and darkfield illumination, and a real-time autofocus module.

By automating the inspection process, F2X provides numerous advantages such as improved inspection accuracy, faster inspection times, and reduced reliance on manual inspection. It helps semiconductor manufacturers enhance their yield, minimize defects, and optimize their production processes.