SPEA America LLC

Tyler,  TX 
United States
http://www.spea.com
  • Booth: 1161

We deliver answers for the test challenges of tomorrow

Overview

Established in 1976, SPEA is a world leader in the field of automatic test equipment. 
Product portfolio includes: 
- Complete test cells for MEMS devices, combining pick&place handling, testing, contacting, and physical stimulus (for acceleromenters, gyroscopes, pressure sensors, environmental and gas sensors, humidity sensors, silicon microphones and speakers, proximity and ToF sensors, magnetic sensors, light sensors, 6/9 DoF sensors) for single-function or COMBO MEMS
- Analog Mixed-Signal semiconductor testers, designed to drive down the cost of test of the devices of 50%, through a high-efficiency architecture 
- Test Cells for Power Modules, MOS, IGBT
- Double-sided Wafer Prober and Tester for complete, high-throughput tests at wafer level for the most challenging applications
- Flying Probe Testers,  for testing PCBs, probe cards, load boards
- In-Circuit Board Testers, offering highest throughput 


  Products

  • DOT800 - Multi-Core Analog Mixed Signal Tester
    DOT800 combines the capabilities of 2 testers into a single, test-head-only system. Its innovative device-oriented instrumentation incorporates all the resources for analog, digital, and signal processing in a single, powerful, configurable board....

  • DOT 800 is a multi-core analog mixed signal tester, offering test capabilities of two testers in a single, very compact system. Test capabilities address the requirements of a broad range of products: from MEMS and sensors to automotive devices, from PMIC’s to converters, LED drivers, 5G Devices, and more. 

    DOT800 is composed of two independent system cores, in less than 0,3 cubic meters. Each core is equipped with a dedicated CPU, to execute a test program in fully asynchronous mode, thus guaranteeing full parallel test efficiency.

    This architecture offers great advantages both in terms of time to market and test speed.

    Featuring up to 128 digital channels on a single instrument, the new channel option enables the DOT800 to perform high multi-site, cost-efficient testing of high-speed communication interface devices, which require a spread spectrum modulation on channels and clock signals to verify their signal integrity and robustness against EMI.

    DOT800 instrument architecture incorporates all the resources for analog, digital and signal processing in a single, powerful board for multi-site testing, including multiple control CPUs, DSP modules and programmable logic units. This configurable tester-in-a-board module allows you to populate DOT800 with one-type instruments, greatly simplifying system composition, programming and maintenance, while satisfying at best all the device test requirements – and go even beyond.

  • DOT800T - Power Semiconductor Tester
    DOT800T provides a complete solution for Power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications, from wafer level to final product test....

  • DOT800T provides a complete solution for Power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications. This tester is expressly designed to address the test requirements of traditional Silicon devices as well as new Gallium Nitride and Silicon Carbide technologies, covering their performance range with the highest voltage and current source capabilities, high frequency and low current measurement capabilities.

    The correct device operation is verified under actual working conditions with complete and accurate dynamic tests, static test and isolation test sequences, to guarantee the quality and reliability of every device.
    All of this, in a high-throughput, modular and configurable tester, designed for mass-production environments.

    A multi-core architecture allows DOT800T to perform accurate static, dynamic and isolation tests on dedicated stations, each of which with a dedicated independent controller. The different test programs are performed in a true parallel, asynchronous mode, since each test core controller manages test resources, instrument connections, and test program execution.


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