June 4th, 2024 – Turin (Italy)
SPEA is pleased to announce its participation at the upcoming Semicon West trade fair, taking place on July 9-11, 2024, at the Moscone Center in San Francisco. Building on the success of last years’ events, SPEA will once again showcase its innovative testing technologies at booth #965, South Hall.
At the Moscone Center, SPEA’s innovation and expertise will position the brand as a premiere technology solutions company in an industry where product quality and reliability are of the utmost importance.
At booth #965 located in South hall, SPEA will showcase its envision of the future of testing, with an exhibition of the following new technologies.
Revolutionizing test efficiency with SPEA DOT platform
Visitors to the SPEA booth will have the opportunity to experience the future of testing with the SPEA Device Oriented Tester (DOT) platform. This revolutionary mixed-signal tester leverages a unique "tester-in-a-board" concept, integrating all test resources onto a single board. This simplifies connections between tester channels and devices under test, streamlining the entire testing process.
The DOT's multi-processor, multi-function channel architecture seamlessly combines analog, digital, and signal processing capabilities. This includes multiple control CPUs, DSP modules, and programmable logic units. The modular and configurable design allows for the inclusion of an on-board controller and up to four channel cards, enabling customization to perfectly match individual testing requirements. Each channel card boasts a dedicated matrix card, further simplifying load board design and reducing relay usage. SPEA's DOT platform eliminates the need for multiple instruments of different types, allowing for a system comprised of identical, replicable instruments. This significantly reduces system complexity, simplifies programming and maintenance, and ensures exceptional device test coverage.
Comprehensive Power Semiconductor Testing Solutions
SPEA will also be showcasing its DOT800T platform, a comprehensive solution for power semiconductor testing. This versatile platform integrates all necessary resources for performing ISO, AC, and DC tests on a wide range of power applications within a single machine. Designed specifically for testing traditional silicon devices alongside cutting-edge Gallium Nitride and Silicon Carbide technologies, the DOT800T boasts industry-leading voltage and current source capabilities, along with high-frequency and low-current measurement precision.
The DOT800T's multi-core architecture facilitates accurate execution of static, dynamic, and isolation tests across dedicated stations, each equipped with an independent controller. Multiple test programs can be run concurrently in asynchronous mode, with each core controller managing its own resources, instrument connections, and test program execution.
Join SPEA at Semicon West 2024
SPEA invites all Semicon West attendees to visit booth #965 to explore the future of semiconductor testing with the SPEA DOT platform and DOT800T solutions. SPEA's team of experts will be on hand to answer questions and demonstrate the capabilities of these innovative testing technologies.