The FXE series is designed for non-destructive quality assurance, off-line inspection, and measurements of parts with defects in the low micrometer range.
The microfocus and nanofocus resolution x-ray modules allow clear feature recognition in various applications:
- Electronics inspection
- Soldering joints on circuit boards – PCBA
- Ball grid arrays – BGA
- Integrated circuits – IC
- Bonding wires
- Semiconductor packaging and interconnects
- Wafer-level chip-scale packages
- Microelectromechanical systems - MEMS
Unlimited lifetime
Our modular design facilitates the quick replacement of critical parts, making the FXE’s total cost of ownership among the lowest in its class. You’ll never have to worry about running the tube at its limit, as you can always replace the wear-parts; the tube is designed to last well beyond the expected life cycle of any systems it’s integrated into.
Benefit from the stability, brightness, and sharpness of our FXE modules by combining it with a high-performing X-ray detector to experience superior image quality and in-depth nanoscale analysis.