High precision smart film thickness meter with a simple and intuitive interface even beginners can easily operate.
- Portable: light at 1.1 kg and easy to carry
- High precision and easy measurement: Measurements down to the thinnest 1 μm are possible without the need for a calibration curve.
- Non-destructive/non-contact measurement: Measures without damaging the sample.
- Measure various samples: Measurement is possible regardless of the base material (glass or plastic).
- Measurement results: Uses a simple interface, making it easy to set conditions. In addition, the absolute value of the film thickness is displayed. Also possible to keep the necessary measurement.
Film thickness measurement principle: Reflection spectroscopy (optical interferometry)
SM-100S measures film thickness using a method called reflection spectroscopy (optical interferometry). For example, when measuring a film coated on a substrate, light incident from above the target sample is reflected by the film surface. Furthermore, the light that passes through the film is reflected at the substrate and film interface. The optical interference phenomenon caused by the phase shift (phase difference) due to the optical path difference at this time is measured, and the film thickness can be determined from the obtained reflection spectrum and refractive index.