Bowman Analytics

• Booth: 5767

Overview

Bowman introduces ARCHER™, the most important software development in a decade for users of XRF analyzers.  ARCHER allows 1 instrument to provide precise coating thickness, composition and solution analysis. Software yields precise results regardless of the variable density that occurs over the bath’s life. Bowman instruments are IPC4552 A/B capable, and are best available XRF technology for ENIG/ENEPIG, HASL, %P. Bowman's 8 XRFs measure up to 5 layers; all have Silicon Drift Detectors for maximum peak resolution and shorter measurement times. “W” Series Micro XRF and (new!) cleanroom-ready A Series use poly-capillary optics to focus the beam to 7.5 µm FWHM -world’s smallest beam size for coating thickness analysis using XRF; ASTM B568, DIN 50987, ISO 3497, SEMI S8. “P” Series was engineered for large PCBs and flat panels; available with Large Window SDD. Multiple stage options accommodate widest range of sample sizes. Local support: service, recertifications, reference standards.  

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