Behind Every Parametric Test Breakthrough
Explore our parametric test solutions at SEMICON West 2024. Chroma 3530 Parametric Test System represents a paradigm shift in wafer testing. Each aspect of its design contributes to reducing the cost per wafer, enhancing test quality, and ensuring uncompromised coverage.
For Legacy, Advanced Nodes and Flash Memory
Our Hyperion Software Platform simplifies the parametric testing workflow by minimizing time and difficulties associated with training, operating, debugging, and analysis. It also offers a unified platform that supports various instruments, offering a cost-effective and gradual upgrade path tailored to your budget and timelines.
Discover How Chroma Simplifies Your Work with 3530 and Hyperion
Join us at booth 5754 to explore the benefits of Chroma 3530 in streamlining your testing process. The cost-effective solution ensures seamless data correlation between benchtop instruments and production parametric testers. Don't miss the chance to learn how our Hyperion Platform can unify your test shell and test cell in the reliability lab across various instruments.