Bowman Analytics

The K Series was developed for quality departments that handle a wide range of samples. The collimated system has a class-leading 12″ x 12″ measurable area on parts up to 8.75″ tall. A multi-collimator package accommodates various feature sizes; a variable camera allows measurements at focal distances from 0.25″ to 3.5″.

A servo motor-driven programmable stage allows for fast and precise programmable sample positioning. The cantilever door design gives operators easy access for sample placement. Available table view functionality images the entire measurable area and allows the operator to navigate to any location with a single click. An optional built-in joystick lets operators move the XY stage from the system's control panel without software intervention.

The K Series is also available with a standard optics configuration with a 15μm FWHM optics and a high resolution LSDD detector. A high precision programmable X-Y sample stage offers stage precision down to less than 80µin.

The A Series Micro XRF was engineered for precise measurement of the smallest X-ray features found in semiconductors and microelectronics. It uses poly-capillary optics to focus the X-ray beam to 7.5 μm FWHM, the world's smallest for coating thickness analysis. A 140X magnification camera is used to measure features on that scale; it is accompanied by a secondary, low magnification camera for live-viewing samples and birds-eye macro-view imaging. Bowman's dual-camera system lets operators see the entire part, click the image to zoom with the high-mag camera, and pinpoint the feature to be programmed and measured.

A programmable stage with 600 mm XY travel handle the largest samples in the industry. The stage has precision less than +/- 1μm for each axis. Bowman pattern recognition software and auto-focus features also do this automatically. The system's built-in pattern recognition can be used to view the topography of a coating on a part such as a silicon wafer.

The P series offers the flexibility of measuring a wide variety of sample sizes, shapes, and quantities. It is equipped with a high precision programmable X-Y stage that offers several convenience factors over a fixed stage. P Series was designed for testing large PCBs or flat panels. it is available with 3 sample stage options up to 16"x16". Operators can use the mouse and software interface to move to desired measurement locations easily. Multi-point programs can be created to automatically measure multiple sample locations with the click of a button. Pinpoint control is achievable for testing critical areas. Larger sampling volumes are possible through multi-point programming.

The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera for measurement in recessed areas. Collimators and focal distances can be customized to the application. An SDD detector is included, along with our long-life micro-focus x-ray tube.