The PoS² is the latest addition to a broader range of D-ReX solutions developed for the different monitoring requirements found within semiconductor facilities. Depending on the application, the appropriate measurement concept is determined by factors including the target gas, expected concentration, process conditions and location of the measurement point.
Some semiconductor gases also require an additional step before they can be reliably detected. For these applications, GfG uses pyrolysis technology. The target gas is heated to a defined temperature and decomposed into measurable reaction products. These products are detected by the sensor, allowing the D-ReX to determine the concentration of the original target gas. For example, NF₃ can be thermally decomposed and detected via the resulting HF concentration.
Together, these different approaches enable gas monitoring concepts to be tailored to specific areas and processes within a fab rather than applying the same detection method to every measurement point.