Hprobe

EYBENS - FRANCE,  France
http://www.hprobe.com
  • Booth: 6672

Discover our Magnetic ATEs to test MRAM and Magnetic Sensors

Overview

Hprobe is a recognized leader in magnetic device testing, providing high-speed, high-precision solutions for the characterization of MRAM and magnetic sensors. Its technology supports the development and production of magnetic components used in fast-growing applications such as AI, AR/VR, and the automotive industry—where performance, reliability, and scalability are critical. In March 2025, Hprobe joined Mycronic, gaining new resources to accelerate its global expansion and innovation. Hprobe offers a unique, patented multidimensional magnetic field generator technology for wafer-level characterization and testing of magnetic devices and sensors. Its product portfolio includes dedicated tools for the testing and characterization of MRAM devices (STT, SOT, VCMA) and magnetic sensors (TMR, GMR, etc.) across all stages of development. Founded in March 2017 and headquartered in Grenoble, France, Hprobe is a spin-off from SPINTEC—one of the world’s leading spintronics research labs.


  Press Releases

  • Designed to meet the testing needs of next-generation TMR sensors used in automotive electrification, industrial automation, mobile devices, and robotics

    Grenoble, France – October 28, 2025

    Hprobe, a Mycronic company and the leader in magnetic test equipment (ATE) for the semiconductor industry, announces the introduction of its new magnetic test instrument dedicated to wafer-level testing of the latest generation of TMR (Tunnel Magnetoresistance) sensors under 3D magnetic field conditions. The H3DM-XLL sets a new benchmark in magnetic field strength and control, delivering unprecedented performance for the development and production of advanced TMR sensors. The growing demand for TMR sensors driven by automotive electrification, industrial automation, mobile devices, and robotics is creating new testing challenges that this system is uniquely positioned to address. Hprobe has already received initial customer orders for this disruptive test capability.

    Meeting the Testing Needs of Advanced TMR Sensors

    Magnetic sensor ICs have become essential to modern electronics, enabling accurate detection of position, speed, current, and orientation. Among them, TMR sensors stand out for their high sensitivity, low power consumption, and seamless CMOS compatibility. Over the past decade, they have moved from research prototypes to large-scale adoption. Their growing complexity requires precise wafer-level control of 3D magnetic fields in terms of orientation, magnitude, and uniformity, creating new technical and throughput challenges for sensor manufacturers and test equipment suppliers.

    As TMR sensor designs evolve toward higher performance and greater sensitivity, they require testing up to magnetic saturation along all spatial directions, a capability that existing wafer-level systems have been unable to provide until now. The H3DM-XLL addresses this need by combining extreme magnetic field capability with precise and quick 3D vector control, ensuring reliable and repeatable characterization across the full operating range of today’s advanced TMR devices.

    A New Breakthrough for the Industry

    “With this new product, Hprobe is making a major breakthrough in magnetic field capabilities for wafer-level testing of magnetic sensors,” said Dr. Siamak Salimy, Founder and CTO of Hprobe. “This development is the result of close collaboration with TMR sensor manufacturers. Several technical challenges have been resolved to tailor this new 3D magnetic generator specifically for the most advanced TMR sensor technologies.”

    Unmatched Magnetic Field Performance

    As the newest member of Hprobe’s 3D magnetic generator family, the H3DM-XLL enables vectorial magnetic field generation above 200 millitesla (mT) in any direction of space, reaching over 500 mT in-plane and more than 250 mT out-of-plane, on a large uniform area. These capabilities make it the only commercial solution providing such high field strength and full 3-axis vector control for waferlevel testing and characterization of magnetic sensors.

    Additional key features include:

    • High throughput testing with magnetic field sweep rates up to 2 Tesla per second
    • Precise field calibration and repeatability for accurate wafer-level characterization
    • Compatibility with standard probers and ATEs, enabling easy adoption in existing test lines
    • Support for 200 mm and 300 mm wafers for both R&D and production environments

    Direct docking with wafer probers and seamless communication with external ATEs through dedicated control commands and trigger signals for synchronous operation. This new system is compatible with both standard and custom ATEs and integrates effortlessly into existing test setups, ensuring smooth deployment in semiconductor environments.

    Extending Hprobe’s Leadership

    The H3DM-XLL extends Hprobe’s portfolio of magnetic test heads, following the successful H3DM and H3DM-XL models already used in research, development and production by leading semiconductor manufacturers worldwide. It further reinforces Hprobe’s leadership in magnetic testing instruments for wafer-level characterization of MRAM and magnetic sensor devices.

    About Hprobe:

    Founded in March 2017 and headquartered in Grenoble, France, Hprobe is a business line of Mycronic’s Global Technologies division. Building on years of advanced research in magnetic testing as a spin-off from SPINTEC—one of the world’s leading spintronics research laboratories— the company delivers cutting-edge solutions for the semiconductor industry and is recognized today as the global leader in magnetic test equipment for the semiconductor industry. The company designs, manufactures, and markets automated wafer-level testing solutions for magnetic devices such as MRAM and magnetic sensors, serving major semiconductor foundries, IDMs, and research institutes worldwide. Its patented 3D magnetic field generator technology enables precise and repeatable testing under fully controlled magnetic conditions, covering all magnetic testing needs from R&D to highvolume production. With systems deployed across consumer, industrial, automotive, and communication markets, Hprobe continues to set the standard for precision, throughput, and overall performance in magnetic device testing.

  • Overview

    NY Creates is actively developing both STT-MRAM and SOT-MRAM technologies at the device R&D and process development stages. In this context, achieving accurate, repeatable, and scalable magnetic testing is essential to support technology development and prepare for future manufacturing.

    To address these needs, NY Creates deployed Hprobe’s IBEX wafer-level test platform, a turnkey solution combining 3D magnetic field generation, high-speed electrical testing, and full automation.


    The Challenge

    Prior to adopting Hprobe’s solution, magnetic testing capabilities at NY Creates were limited to a 2T inline magnet with simple one-dimensional field projection. This setup enabled basic magnetic stimulation but did not support more advanced use cases.

    In practice, characterization relied on purely electrical switching measurements, without magnetic field supplementation. As MRAM technologies evolved, this approach became limiting, particularly for SOT-MRAM.

    One of the key challenges was the inability to apply controlled magnetic fields in the plane of the device (Hx and Hy). As a result, SOT-MRAM devices could not be properly measured, since their switching behavior depends on in-plane magnetic conditions.

    At the same time, ensuring repeatability across wafers and consistency between R&D and process development activities became increasingly important.


    Requirements

    To support its MRAM roadmap, NY Creates required a test solution capable of delivering:

    • High repeatability across experiments and wafers
    • Wafer-level integration for consistent cross-wafer measurements
    • Accurate multi-axis magnetic field control (X, Y, Z)
    • Combined magnetic and electrical testing
    • Support for high-speed pulsed measurements

    These capabilities were necessary to move beyond basic characterization and enable a deeper understanding of device behavior.


    Hprobe’s Solution

    NY Creates implemented Hprobe’s IBEX ATE platform, designed specifically for magnetic device testing at the wafer level.

    At the core of the system is the H3DM robotized test head, mounted on a wafer prober and integrating a proprietary 3D magnetic field generator. This enables controlled magnetic field application along all three axes, with field strengths up to 600 mT in the perpendicular direction and 100 mT in-plane, while maintaining good field uniformity over the device area.

    The platform also integrates a complete electrical test environment, including waveform generation, amplification, and measurement instrumentation, all controlled through a modular software environment for sequencing, parameter extraction, and multi-device management.

    A key component is the RF Spin module, which enables advanced pulsed measurements. It supports pulse widths from 200 picoseconds to 200 nanoseconds, synchronized dual-channel operation with sub-100 picosecond timing, and fast bit error rate testing with millions of cycles completed in seconds. These capabilities are essential for time-resolved analysis of STT and SOT devices.

    “As we advance both STT-MRAM and SOT-MRAM development at NY Creates, having a test platform that combines precise 3D magnetic field control with high-speed electrical measurements is essential. Hprobe’s IBEX system has enabled us to significantly improve the confidence and repeatability of our characterization, while making it possible to fully evaluate SOT-MRAM devices for the first time. This is a key step in supporting both our R&D and process development activities.”

    — NY Creates Associate Vice President for Business Development Frank Tolic


    Results and Benefits

    The deployment of IBEX has significantly improved MRAM testing capabilities at NY Creates.

    First, it enables simultaneous magnetic and electrical characterization, providing a more complete view of device behavior compared to previous electrical-only approaches. This has led to improved confidence in measurement results.

    Second, the platform makes it possible to accurately characterize SOT-MRAM devices, thanks to precise control of magnetic fields along the X and Y axes. This was not achievable with previous test setups.

    Third, the system allows controlled sweeping of magnetic fields—both perpendicular and in-plane—while monitoring device resistance. This enables extraction of hysteresis curves, providing direct insight into switching behavior and data retention.

    In addition, wafer-level integration ensures consistent and repeatable measurements across the wafer, supporting both R&D and process development activities.


    Advantages Over Previous Approaches

    Compared to earlier methods, the IBEX platform provides a fully integrated and controlled test environment.

    Previous approaches relied either on inline DC switching or on standalone electrical characterization tools with limited pulsing capabilities. These methods did not allow combined magnetic and electrical testing under controlled conditions.

    Alternative setups would have required combining multiple instruments, often leading to accurate electrical measurements but less reliable magnetic field control.

    In contrast, IBEX delivers a turnkey solution, integrating 3D magnetic field generation and electrical testing in a single platform, ensuring consistency, accuracy, and ease of use.


    Future Outlook

    As MRAM technologies continue to evolve, testing requirements are expanding toward more advanced use cases such as magnetic immunity testing, which requires precise control of magnetic field strength and angle in three dimensions.

    Hprobe’s platform already supports this type of testing through adjustable magnetic field orientation and strength, enabling angle-resolved measurements.

    Beyond MRAM, the system can also be used for other memory technologies. In particular, the RF modules support ReRAM testing, extending the applicability of the platform within NY Creates’ broader ecosystem.


    Conclusion

    By deploying Hprobe’s IBEX platform, NY Creates has significantly enhanced its MRAM testing capabilities.

    The combination of accurate 3D magnetic field generation, high-speed pulsed electrical testing, and wafer-level automation enables more reliable characterization, supports process development, and prepares the path toward future manufacturing.

    This integrated approach provides the level of control and repeatability required for next-generation memory technologies, including both STT-MRAM and SOT-MRAM.


    About NY Creates

    NY Creates serves as a lab-to-fab bridge for advanced electronics, fostering public-private and industry-academic partnerships for technology development and innovation. NY Creates attracts and leads industry-connected innovation and commercialization projects that secure significant investment, advance R&D in emerging technologies, and generate the jobs of tomorrow. NY Creates runs some of the most advanced facilities in the world, boasts more than 2,700 industry experts and faculty, and manages public and private investments of approximately $25 billion—placing it at the global epicenter of high-tech innovation and commercialization. Learn more at www.ny-creates.org.


    About Hprobe

    Founded in March 2017 and based in Grenoble, France, Hprobe is part of Mycronic’s Global Technologies division. Originating as a spin-off from SPINTEC, a leading spintronics research lab, the company provides advanced magnetic test solutions for the semiconductor industry and is now a global leader in this field. Hprobe designs and manufactures automated wafer-level testing systems for magnetic devices such as MRAM and sensors, serving foundries, IDMs, and research institutes worldwide. Its patented 3D magnetic field generator enables precise, repeatable testing under controlled conditions, from R&D to high-volume production. With systems used across consumer, industrial, automotive, and communication markets, Hprobe sets the benchmark for precision, throughput, and performance in magnetic testing. www.hprobe.com


    About Mycronic

    Mycronic is a Swedish high-tech company engaged in the development, manufacture and marketing of production equipment with high precision and flexibility requirements for the electronics industry. Mycronic’s headquarters are located in Täby, north of Stockholm and the Group has subsidiaries in China, France, Germany, Japan, Mexico, the Netherlands, Singapore, South Korea, Thailand, United Kingdom, United States, and Vietnam. Mycronic is listed on Nasdaq Stockholm. Learn more at www.mycronic.com


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