Acroview Technology Co.,Ltd.

Post Silicon Validation (PSV) covers all validations and testingfrom chip tape-outto mass production.Acroview's PSV test system, built on 20 years of platform-basedhardware/software design for chip testing, integrates testautomation across the full lifecycle from R&D to massproduction, helping Fabless and IDM establish efficient testingprocesses and data analysis foundations.

Acroview's V9000 series Tester are used for Burn-In Testingfor products such as high-reliability power modules for Alservers, Al large model training chip SOCs, GPUs, CPUs, andautomotive ADAS/Self-driving SOCs. The V9000 series fullyautomatic burn-in test machine revolutionarily proposes a"Full Online" Burn-In test solution, incorporating the entireBurn-In test process into an automatic control process toavoid unrecorded, untraceable, and potential ESD riskscaused by manual intervention. At the same time,Acroview's TempJITT high-power burn-in test temperaturecontroltechnology can supporta single DUT power of up to1500W, which is more than 1.5 times the maximum powersupport capability of current traditional burn-in testequipment.

V9000-SLT-M is a high-performance memory chip SLT solution.This equipment is mainly used for automatic SLT test and sortingof products such as eMMC, eMCP, LPDDR, UFS, and UMCP in roomtemp to high-temperature environments.
Ultra-high UPH: Up to 6,000 units per hour.Independent temperature control design: Delivers excellent temperaturecontrol accuracy and consistency for target DUTs.Integrated high-precision measurements: Supports DC tests such as OS/Leakageand IDD6.