Born out of the need for high-speed, high-accuracy measurement/ inspection of fast-evolving electronic components, NIDEC ADVANCE TECHNOLOGY products reflect the culmination of our longstanding experiences in a variety of elemental technologies. Our technical portfolio today realizes extensive application in:
- mission-critical, high-performance integrated circuits and associated software
- hardware design enabling submicron control
- component fixture operation for processing and assembling multi-pin and narrow-pitch chips, and
- two- and three-dimensional optical imaging and three-dimensional process technology
NIDEC ADVANCE TECHNOLOGY’s main strength derives from the ability to blend a wide range of elemental technologies to the industry's highest level of performance.
・Automatic Test Equipment: NIDEC ADVANCE TECHNOLOGY GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA). NIDEC ADVANCE TECHNOLOGY offers an array of testing equipment used to conduct open/leak tests on motherboards, as well as many other printed circuit boards. NIDEC ADVANCE TECHNOLOGY provides open/leak inspection system for touch screen panel and LCD, at singulated size to multifaced size, making use of our diversed contact & non-contact technologies.
・Automated Optical Inspection Equipment: NIDEC ADVANCE TECHNOLOGY's inspection systems serve to locate open/leak circuits on printed substrates forming different conductor patterns within photomasks and inner/outer layers. These vision inspection systems are also used to measure the shape of via holes and solder bumps and to find scratches and stains on them.
・Probe Card: Our probe cards are a perfect solution for advanced wafer testing challenges.