SE Technologies Corp.

Shanghai,  China
http://www.se-group.com
  • Booth: 2703

Engineers see testing requirements from their perspective.

Overview

Advanced equipment, Timely Support  !

                                     SE TECHNOLOGIES, SEE YOUR NEEDS !

SE TECHNOLOGIES CORP.  is the world's leading solution provider in the fields of RF/Microwave, Semiconductors, Optoelectronics and Electronics.

Founded on 1993,  SE TECHNOLOGIES CORP.  originated from engineers and understands the needs of engineers. From RF/Microwave, Semiconductors,  High Precision Electronics, and Opto-Electronics to recent MEMS and Nano Technologies, The coming of the 5G Era, SE Technologies introduces the world's leading solutions to the Greater China area engineers. Finding the best tools to help engineers become successful has been SE's mission and honor for thirty years.

Product

•  Wafer-level high-precision probe station and related peripheral devices
•  Micro-nano pitch probes, probe cards, positioners (probe holders)
•  PCB signal integrity testing and high frequency probes
•  ESD electrostatic discharge test equipment
•  Advanced Channel Simulator
•  Analogy of RF links between terrestrial and satellite wireless systems
•  RF/Microwave Test Fixtures, PCB Test Fixtures
•  Phase Noise Analyzer………

Product Application
•  Automatic Impedance Tuning System
•  High power test, semiconductor electrical property measurement…,  TDR/TDT
•  Reliability Test System
•  Failure Analysis
•  Aviation/satellite,  new energy vehicles, optoelectronics/optics,  etc.

web: www.se-grup.com   双程科技公司

Contact : [email protected]

  Press Releases

  • (Jan 20, 2025)
  • (Jan 20, 2025)
  • (Jan 20, 2025)
  • (Jan 21, 2025)
  • (Jan 21, 2025)

  Products

  • Semiconductor Detection Probe Station
    Offered a comprehensive line of Precision DC/RF probe station for on-wafer probing. Chip/Packaging/Module Measurement，Chip/Packaging/Module Measurement; Manual, semi-automatic, 4-inch, 6-inch, 8-inch, 12 inch...

    • For on-wafer probing Precision DC/RF Probe Station

    Chip/Packaging/Module Measurement
    Manual, Semi-Automatic, 4-inch, 6-inch, 8-inch, 12 inch

    ■  DC parameters, high-frequency parameters
    ■  High voltage and high current testing, IV/CV Testing
    ■  Load traction, Noise parameters
    ■  Failure Analysis and Reliability Testing
    ■  HF & RF Microwave Probing
    ■  DC To THz Probe Head Selection

    Features
    ■  Temperature range:- 65℃~600℃
    ■  Low leakage: fA
    ■  Frequency range: DC~THz
    ■  Nano resolution probe holder

    Contact SE TECHNOLOGIES  双程科技公司

       Mail：[email protected]

  • High Power Semiconductor Testing
    Characterize High-Power Devices at the Wafer Level The “PowerPro” power device characterization system enables safe and accurate over temperature, low contact resistance measurements of power semiconductors up to 3 kV (Triax) / 10 kV (Coax)...

    • Wafer level reliability and failure analysis
    Manual, semi-automatic, 4-inch, 6-inch, 8-inch, 12 inch

    ■  Temperature range: normal temperature~200 ℃, 300℃
    ■  Chuck
        Voltage: 3KV Three-axis, 10KV Dual Axis, 20KV single core
        Current: 100A~500A Pulse, 10A DC
    ■  High Voltage Probe: 1KV, 3KV, 10KV, 20KV
    ■  CV/IV Measurements & Failure Analysis
    ■  HF & RF Microwave Probing
    ■  Millimeter Wave Probing
    To learn more about High-Power Testing, please contact us

    Contact SE 双程科技公司

    : [email protected]

  • Resistivity Measurement System
    Complete Resistivity Measurement Systems Reports standard resistivity, resistivity standard deviation, average sheet resistance, and sheet resistance standard deviation. TCR Measurements and Dual configuration testing Automated 2D & 3D contour mapping...

    • Complete Resistivity Measurement Systems
    Reports Standard Resistivity, Resistivity Standard Deviation, Average Sheet Resistance, and Sheet Resistance Standard Deviation.

    TCR Measurements and Dual configuration testing

    Automated 2D & 3D contour mapping

    ■  Manual, semi-automatic
    ■  Optional measuring range: 1μΩ ~ 10GΩ
    ■  Optional temperature range: room temperature ~ 600℃
    ■  A variety of Four-Point Probe Heads are available
    ■  2D and 3D resistance map can be displayed
    ■  Kelvin Probe or probe card for standard TCR testing
    ■  Automatic positioning measurement

    Would like to more information, Please Contact SE TECHNOLOGIES CORP.

    Resistivity Measurement System

    Mail : [email protected]

  • Resistivity Measurement System
    Complete Resistivity Measurement Systems Reports standard resistivity, resistivity standard deviation, average sheet resistance, and sheet resistance standard deviation. TCR Measurements and Dual configuration testing...

    • Complete Resistivity Measurement Systems
    Reports Standard Resistivity, Resistivity Standard Deviation, Average Sheet Resistance, and Sheet Resistance Standard Deviation.

    TCR Measurements and Dual configuration testing

    Automated 2D & 3D contour mapping

    ■  Manual, semi-automatic
    ■  Optional measuring range: 1μΩ ~ 10GΩ
    ■  Optional temperature range: room temperature ~ 600℃
    ■  A variety of Four-Point Probe Heads are available
    ■  2D and 3D resistance map can be displayed
    ■  Kelvin Probe or probe card for standard TCR testing
    ■  Automatic positioning measurement

    Would like to more information, Please Contact SE TECHNOLOGIES CORP.

    Resistivity Measurement System

    Mail : [email protected]

Categories

200 Equipment, Assembly
  • Cleaning; Washing Equipment for Assembly & Packaging
  • Marking; Imprinting; Labeling Equipment
  • Molding; Encapsulation; Decapsulation Equipment
    • 201 Equipment, Flat Panel Display
  • Laser Treatment; Cutting Systems for Panels & Photocells
  • Liquid Crystal Injection or Filling Equipment
    • 202 Equipment, General Use
  • Cutting; Drilling; Laser ablation; Beveling Equipment
  • Heating; Annealing; Curing Equipment - Furnaces; Conveyors; Ovens; Test Chambers; Heat Treating
  • Vibration Isolation Systems
    • 203 Equipment, Inspection & Measurement
  • CV (capacitance-to-voltage) Probe systems
  • Die Inspection; Die Shear
  • Film Thickness; Thickness; Uniformity Measurement; Ellipsometer
  • Instruments; Bench Top Test
  • Microscopes: Optical Microscopes
  • Resistivity Measurement; 4 point probe; Sheet resistance
  • Thermal Sensing, Measurement, Analysis
    • 205 Equipment, Nanotechnology
  • Equipment, Nanotechnology Tools
    • 207 Equipment, Process
  • Coat; Develop; Resist Processing; Track Equipment
  • Etching; Stripping; Ashing - Dry and Wet Equipment
  • Lithography; Exposure; Aligners; Direct Write Systems; Steppers; Scanners; Nanoimprint
  • Spin on Glass (SOG); on Dielectric (SOD) Track systems
  • Wafer Identification; Marking Equipment
    • 208 Equipment, Test
  • Burn-In Systems
  • Discrete Component Test Systems
  • Failure Analysis Systems
  • FPD Test; Measurement; Repair Equipment
  • Functional Test Systems
  • Logic Test Systems
  • Optical Test Systems
  • Package Test Systems
  • Parametric Test Systems
  • Printed Circuit Board; Wire Board (PCB or PWB) Test and Repair
  • Probing Equipment incl. Analytical; Circuit; Manual; E-Beam; Optical; Wafer Probers
  • System on a Chip (SOC); Mixed Signal Test Systems
  • Wireless, non-contact Test Systems
    • 309 Materials, Test
  • Test Sockets; Contactors and Contact accessories
    • 401 Sub-systems
  • Motion control systems; Servo control systems & Components
  • Optics; Lens Products; Auto-Focus Systems
    • 601 Design Software
  • EDA - Electronic Design Automation; Circuit Design
    • 603 Simulation, Analysis; Modeling Software
  • Simulation; Characterization; Verification Software
  • Statistical Analysis; Modeling; Cost of Ownership (CoO) Software
    • 700 Manufacturing Services
  • Measurement; Inspection Service
    • 804 Professional Services
  • Sales; Manufacturers Representation or Distributors
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