For on-wafer probing,offered a comprehensive line of superior analytical DC/RF Probe Stations ;
Accessories include microscopes, thermal control systems, software and a variety of probes.
Product Application
Chip/Package/Module Measurement
■ Manual, Semi-Automatic
■ 4 ", 6 ", 8 ", 12"
■ DC parameters, High Frequency Parameters
■ High Voltage, High current test, IV/CV test
■ Load traction, noise...
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