日本語
Providing solutions to your measurement and inspection needs
At this year’s SEMICON Japan, we will introduce our newly announced products and provide the latest information about our wide-ranging EUV lithography-related products, mainstream mask and mask blank inspection systems, and wafer-related inspection systems. We will also have live demonstrations of hybrid laser microscopes. Our staff are standing by to hear your specific measurement and inspection needs and address your need to find the right solution from our standard and customized models including prototypes with special stages, and models for use in production lines. Please be sure to stop by our booth.
Applications
・Depth measurement after via etching ・Copper recess level control for hybrid bonding ・Height measurement after copper pillar revealing and during bump formation